Suppr超能文献

通过电退火降低电活性聚合物的漏电流和介电损耗以实现高压驱动。

Reducing leakage current and dielectric losses of electroactive polymers through electro-annealing for high-voltage actuation.

作者信息

Pedroli Francesco, Marrani Alessio, Le Minh-Quyen, Sanseau Olivier, Cottinet Pierre-Jean, Capsal Jean-Fabien

机构信息

Univ Lyon, INSA-Lyon, LGEF, EA682 F-69621 Villeurbanne France

Solvay Specialty Polymers viale Lombardia 20, 20021 Bollate Italy.

出版信息

RSC Adv. 2019 Apr 26;9(23):12823-12835. doi: 10.1039/c9ra01469a. eCollection 2019 Apr 25.

Abstract

Electroactive polymers (EAPs) such as P(VDF-TrFE-CTFE) are very promising in the field of flexible sensors and actuators. Their advantages in smart electrical devices are due to their low cost, elastic properties, low density, and ability to be manufactured into various shapes and thicknesses. In earlier years, terpolymer P(VDF-TrFE-CTFE) attracted a lot of research due to its relaxor-ferroelectric property that exhibits high electrostriction phenomena. While widely used in flexible actuation, this class of material is still limited by the high electric fields required (≥30 V μm) to achieve sufficient strain levels (>2%). This inevitably leads to high levels of leakage current and thus a short lifetime. This paper proposes a new approach based on electro-annealing thermal treatment for a pure terpolymer P(VDF-TrFE-CTFE) matrix in order to limit the conduction mechanisms. This in turn reduces the dielectric losses at a high level of electric fields. The experimental results demonstrate that a huge decrease in leakage current of 80% is achieved for a wide range of electric fields ( up to 90 V μm) with a 4-fold extension in time-to-breakdown at high voltage excitations of 40 V μm.

摘要

诸如聚(偏二氟乙烯 - 三氟乙烯 - 氯三氟乙烯)(P(VDF-TrFE-CTFE))之类的电活性聚合物(EAPs)在柔性传感器和致动器领域非常有前景。它们在智能电气设备中的优势源于其低成本、弹性特性、低密度以及能够被制造成各种形状和厚度。早些年,三元共聚物P(VDF-TrFE-CTFE)因其具有高电致伸缩现象的弛豫铁电特性而吸引了大量研究。虽然这类材料在柔性驱动中被广泛使用,但要实现足够的应变水平(>2%)仍受到所需高电场(≥30 V/μm)的限制。这不可避免地导致高泄漏电流,从而缩短使用寿命。本文提出了一种基于电退火热处理的新方法,用于纯三元共聚物P(VDF-TrFE-CTFE)基体,以限制传导机制。这进而在高电场水平下降低了介电损耗。实验结果表明,在高达90 V/μm的宽电场范围内,泄漏电流大幅降低了80%,在40 V/μm的高电压激励下,击穿时间延长了4倍。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/b03c/9063747/a474a8fc5278/c9ra01469a-f1.jpg

文献AI研究员

20分钟写一篇综述,助力文献阅读效率提升50倍。

立即体验

用中文搜PubMed

大模型驱动的PubMed中文搜索引擎

马上搜索

文档翻译

学术文献翻译模型,支持多种主流文档格式。

立即体验