Su Yongzhao, Chen Duotian, Yang Siyuan, Zhang Shengsen, Liu Yingju, Fang Yueping, Zhang Qiao, Peng Feng
School of Chemistry and Chemical Engineering, South China University of Technology Guangzhou 510640 China.
College of Materials and Energy, South China Agricultural University Guangzhou 510643 China
RSC Adv. 2019 Aug 27;9(46):26712-26717. doi: 10.1039/c9ra04367e. eCollection 2019 Aug 23.
A photoelectrochemical (PEC) method based on the etching reaction of F ions on the surface of TiO nanorod arrays (TNRs) was proposed for the high sensitivity and selectivity detection of F ions. With the increase of F ion concentration, the surface etching reaction on TNR becomes more intense, resulting in the increased number of surface active sites, the reduction of electron transfer resistance, and the increase of photocurrent density. The prepared TNRs as a PEC probe exhibits a good linear relationship between photocurrent increment and the logarithm of F ion concentration in the range from 0.05 to 1000 nM with an ultra-trace detection limit of 0.03 nM for F ion detection.
提出了一种基于F离子在TiO纳米棒阵列（TNRs）表面蚀刻反应的光电化学（PEC）方法，用于高灵敏度和高选择性检测F离子。随着F离子浓度的增加，TNR表面的蚀刻反应变得更加剧烈，导致表面活性位点数量增加、电子转移电阻降低以及光电流密度增加。所制备的TNRs作为PEC探针，在0.05至1000 nM范围内，光电流增量与F离子浓度的对数之间呈现良好的线性关系，F离子检测的超痕量检测限为0.03 nM。
