Kiefer J
Mutat Res. 1987 May;191(1):9-12. doi: 10.1016/0165-7992(87)90162-x.
The survival of the yeast mutant rad 54-3, which is temperature-conditional for the repair of double-strand breaks, was measured after exposure to UV-light (254 nm) and incubation at 23 degrees C and 36 degrees C. It was found that survival was drastically reduced with incubation at the restrictive temperature. Temperature-shift experiments indicated that repair of UV-induced damage which is controlled by the rad 54 gene proceeds with a half-value-time of about 7 h.
对酵母突变体rad 54 - 3进行了研究，该突变体在双链断裂修复方面具有温度依赖性。在暴露于紫外线（254纳米）后，于23摄氏度和36摄氏度下培养，测定其存活率。结果发现，在限制温度下培养时，存活率急剧降低。温度转换实验表明，由rad 54基因控制的紫外线诱导损伤的修复过程，其半衰期约为7小时。
