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提高平面芯片上探针的原子力显微镜的灵敏度。

Enhancing sensitivity in atomic force microscopy for planar tip-on-chip probes.

作者信息

Çiftçi H Tunç, Verhage Michael, Cromwijk Tamar, Pham Van Laurent, Koopmans Bert, Flipse Kees, Kurnosikov Oleg

机构信息

Department of Applied Physics, Eindhoven University of Technology, PO Box 513,, 5600 MB Eindhoven, the Netherlands.

DRF/IRAMIS/SPEC-LEPO, Centre CEA de Saclay, 91191 Gif-sur-Yvette, France.

出版信息

Microsyst Nanoeng. 2022 May 16;8:51. doi: 10.1038/s41378-022-00379-x. eCollection 2022.

DOI:10.1038/s41378-022-00379-x
PMID:35586140
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC9108095/
Abstract

We present a new approach to tuning-fork-based atomic force microscopy for utilizing advanced "tip-on-chip" probes with high sensitivity and broad compatibility. Usually, such chip-like probes with a size reaching 2 × 2 mm drastically perturb the oscillation of the tuning fork, resulting in poor performance in its intrinsic force sensing. Therefore, restoring initial oscillatory characteristics is necessary for regaining high sensitivity. To this end, we developed a new approach consisting of three basic steps: tuning-fork rebalancing, revamping holder-sensor fixation, and electrode reconfiguration. Mass rebalancing allows the tuning fork to recover the frequency and regain high Q-factor values up to 10 in air and up to 4 × 10 in ultra-high vacuum conditions. The floating-like holder-fixation using soft wires significantly reduces energy dissipation from the mounting elements. Combined with the soft wires, reconfigured electrodes provide electrical access to the chip-like probe without intervening in the force-sensing signal. Finally, our easy-to-implement approach allows converting the atomic force microscopy tip from a passive tool to a dedicated microdevice with extended functionality.

摘要

我们提出了一种基于音叉的原子力显微镜的新方法,用于利用具有高灵敏度和广泛兼容性的先进“芯片上的探针”。通常,这种尺寸达到2×2毫米的芯片状探针会极大地干扰音叉的振荡,导致其固有力传感性能不佳。因此,恢复初始振荡特性对于恢复高灵敏度是必要的。为此,我们开发了一种由三个基本步骤组成的新方法:音叉重新平衡、改进支架-传感器固定以及电极重新配置。质量重新平衡使音叉能够恢复频率,并在空气中重新获得高达10的品质因数,在超高真空条件下高达4×10。使用软线的类似浮动的支架固定显著减少了安装元件的能量耗散。与软线相结合,重新配置的电极在不干扰力传感信号的情况下为芯片状探针提供电连接。最后,我们易于实现的方法允许将原子力显微镜探针从一个被动工具转变为一个具有扩展功能的专用微器件。

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Microsyst Nanoeng. 2020 Nov 2;6:99. doi: 10.1038/s41378-020-00209-y. eCollection 2020.
2
Magnetic Chirality Controlled by the Interlayer Exchange Interaction.由层间交换相互作用控制的磁手性
Phys Rev Lett. 2020 May 22;124(20):207203. doi: 10.1103/PhysRevLett.124.207203.
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Tuning Magnetic Chirality by Dipolar Interactions.通过偶极相互作用调谐磁手性。
Phys Rev Lett. 2019 Oct 11;123(15):157201. doi: 10.1103/PhysRevLett.123.157201.
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Near-Field Scanning Microwave Microscopy in the Single Photon Regime.单光子态下的近场扫描微波显微镜
Sci Rep. 2019 Aug 29;9(1):12539. doi: 10.1038/s41598-019-48780-3.
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Polymer Patterning with Self-Heating Atomic Force Microscope Probes.聚合物的自加热原子力显微镜探针图案化。
J Phys Chem A. 2019 Sep 19;123(37):8036-8042. doi: 10.1021/acs.jpca.9b06056. Epub 2019 Aug 27.
6
The qPlus sensor, a powerful core for the atomic force microscope.qPlus传感器,原子力显微镜的强大核心。
Rev Sci Instrum. 2019 Jan;90(1):011101. doi: 10.1063/1.5052264.
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Optimizing qPlus sensor assemblies for simultaneous scanning tunneling and noncontact atomic force microscopy operation based on finite element method analysis.基于有限元法分析优化用于同时进行扫描隧道显微镜和非接触原子力显微镜操作的qPlus传感器组件。
Beilstein J Nanotechnol. 2017 Mar 20;8:657-666. doi: 10.3762/bjnano.8.70. eCollection 2017.
8
Understanding the STM images of epitaxial graphene on a reconstructed 6H-SiC(0001) surface: the role of tip-induced mechanical distortion of graphene.理解重构6H-SiC(0001)表面上外延石墨烯的扫描隧道显微镜图像:针尖诱导的石墨烯机械畸变的作用。
Phys Chem Chem Phys. 2016 Jun 7;18(21):14264-72. doi: 10.1039/c5cp07571h. Epub 2016 May 11.
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Cleaved thin-film probes for scanning tunneling microscopy.用于扫描隧道显微镜的劈裂薄膜探针。
Nanotechnology. 2016 Jan 22;27(3):03LT01. doi: 10.1088/0957-4484/27/3/03LT01. Epub 2015 Dec 4.
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Coherent interaction with two-level fluctuators using near field scanning microwave microscopy.使用近场扫描微波显微镜与二能级涨落器的相干相互作用。
Sci Rep. 2015 Nov 24;5:17176. doi: 10.1038/srep17176.