Universidad Autónoma Metropolitana, Mexico City, Mexico.
Universidad Autónoma Metropolitana, Mexico City, Mexico.
Appl Radiat Isot. 2022 Aug;186:110291. doi: 10.1016/j.apradiso.2022.110291. Epub 2022 May 17.
Half-life is one of the fundamental parameters to characterize the thermoluminescent (TL) response in ionizing radiation dosimetry. In general, there are two types of important half-lives to model the phenomenon of thermoluminescence (TL). The first type of half-life is the time required for the concentration of trapped charge carriers in a single trap to decrease to half its initial value; this type of half-life is generally denoted as τ. Experimentally, the loss of charge carriers and the corresponding half-life τ are not usually measured directly, but rather the intensity of the TL signal is measured at time t after the start of the experiment. The second type of half-life is the time required for the intensity of the TL to decay to half its initial value. This second type of half-life it is denoted by t. Results of calculating the t half-life of the glow peaks of gamma irradiated BeO are presented. Calculations were made using the expressions derived in previous papers. To make this, the kinetic parameters (order of kinetics, activation energy and frequency factor) were previously determined. Results obtained could be useful in practical situations encountered in medical physics dosimetry.
半衰期是描述电离辐射剂量学中热发光（TL）响应的基本参数之一。一般来说，有两种重要的半衰期类型来模拟热发光（TL）现象。第一种半衰期是单个陷阱中俘获电荷载流子的浓度减少到初始值的一半所需的时间；这种类型的半衰期通常表示为τ。在实验中，电荷载流子的损耗和相应的半衰期τ通常不是直接测量的，而是在实验开始后测量时间 t 时的 TL 信号强度。第二种半衰期是 TL 强度衰减到初始值的一半所需的时间。这种第二种半衰期用 t 表示。给出了γ辐照 BeO 的发光峰的 t 半衰期的计算结果。使用以前的论文中推导出的表达式进行了计算。为此，先前确定了动力学参数（动力学阶数、激活能和频率因子）。在医学物理剂量学中遇到的实际情况下，获得的结果可能是有用的。
