Calculation of the half life for the thermoluminescent signal of Beryllium oxide.

Half-life is one of the fundamental parameters to characterize the thermoluminescent (TL) response in ionizing radiation dosimetry. In general, there are two types of important half-lives to model the phenomenon of thermoluminescence (TL). The first type of half-life is the time required for the concentration of trapped charge carriers in a single trap to decrease to half its initial value; this type of half-life is generally denoted as τ. Experimentally, the loss of charge carriers and the corresponding half-life τ are not usually measured directly, but rather the intensity of the TL signal is measured at time t after the start of the experiment. The second type of half-life is the time required for the intensity of the TL to decay to half its initial value. This second type of half-life it is denoted by t. Results of calculating the t half-life of the glow peaks of gamma irradiated BeO are presented. Calculations were made using the expressions derived in previous papers. To make this, the kinetic parameters (order of kinetics, activation energy and frequency factor) were previously determined. Results obtained could be useful in practical situations encountered in medical physics dosimetry.