Yadav Sweta, Jana Subhendu, Panigrahi Gopabandhu, Malladi Sairam K, Niranjan Manish K, Prakash Jai
Department of Chemistry, Indian Institute of Technology Hyderabad, Kandi, Sangareddy, Telangana 502284, India.
Department of Materials Science & Metallurgical Engineering, Indian Institute of Technology Hyderabad, Kandi, Sangareddy, Telangana 502284, India.
Dalton Trans. 2022 Jun 21;51(24):9265-9277. doi: 10.1039/d2dt01167k.
We report the synthesis of single-crystals of a new transition metal-containing quaternary chalcogenide, BaMnSiTe, synthesized by the solid-state method at 1273 K. A single-crystal X-ray diffraction study shows that it crystallizes in the orthorhombic crystal system (space group: ) with cell constants of = 13.4690(6) Å, = 8.7223(4) Å, and = 10.0032(4) Å. The asymmetric unit of the structure consists of eight unique crystallographic sites: one Ba, two Mn, one Si, and four Te sites. In this structure, the two Mn sites, Mn(1) and Mn(2), are disordered, each with fractional occupancy of 50%. The short distance of 2.170(3) Å between Mn(1) and Mn(2) implies that both Mn sites are not occupied simultaneously. The Mn atoms show two types of polyhedra: unique Mn(1)Te units along with traditional Mn(2)Te tetrahedra. The main motifs of the BaMnSiTe structure are dimeric SiTe units (with Si-Si single bond), Mn(1)Te, and Mn(2)Te polyhedra. The structure can be described as pseudo-two-dimensional if only Mn(1) atoms are present and one-dimensional when only Mn(2) atoms are filled in the structure. The extended 2∞[Mn(1)SiTe] layers and 1∞[Mn(2)SiTe] chains are separated by Ba cations. The direct bandgap for the polycrystalline BaMnSiTe sample is 0.6(1) eV, as determined from an optical absorption study consistent with the sample's black color. The resistivity study of the polycrystalline BaMnSiTe also confirms the semiconducting behavior. The thermal conductivity () values are extremely low and decrease with increasing temperature up to 0.46 W m K at 773 K. The DFT studies suggest that the computed bandgap depends on the magnetic ordering of Mn magnetic moments, and the value varies from ∼0.3-1.0 eV. Relative inter-atomic bond strengths of pertinent atom pairs have been analyzed using the crystal orbital Hamilton populations (COHP).
我们报道了一种新型含过渡金属的四元硫族化合物BaMnSiTe单晶的合成,该单晶是通过固态法在1273 K下合成的。单晶X射线衍射研究表明,它结晶于正交晶系(空间群: ),晶胞参数为 = 13.4690(6) Å, = 8.7223(4) Å, = 10.0032(4) Å。该结构的不对称单元由八个独特的晶体学位置组成:一个Ba、两个Mn、一个Si和四个Te位置。在这种结构中,两个Mn位置,即Mn(1)和Mn(2),是无序的,每个的占有率为50%。Mn(1)和Mn(2)之间2.170(3) Å的短距离表明这两个Mn位置不会同时被占据。Mn原子呈现出两种类型的多面体:独特的Mn(1)Te单元以及传统的Mn(2)Te四面体。BaMnSiTe结构的主要结构单元是二聚体SiTe单元(具有Si - Si单键)、Mn(1)Te和Mn(2)Te多面体。如果结构中仅存在Mn(1)原子,该结构可描述为伪二维结构;当结构中仅填充Mn(2)原子时,则为一维结构。扩展的2∞[Mn(1)SiTe]层和1∞[Mn(2)SiTe]链被Ba阳离子分隔开。通过与样品黑色相符的光吸收研究确定,多晶BaMnSiTe样品的直接带隙为0.6(1) eV。多晶BaMnSiTe的电阻率研究也证实了其半导体行为。热导率( )值极低,在773 K时随温度升高而降低,直至0.46 W m K。密度泛函理论(DFT)研究表明,计算得到的带隙取决于Mn磁矩的磁有序,其值在~0.3 - 1.0 eV之间变化。已使用晶体轨道哈密顿布居(COHP)分析了相关原子对的相对原子间键强度。