Wang S K, Tsiatis A A
Biometrics. 1987 Mar;43(1):193-9.
We present a class of group sequential tests, indexed by a single parameter, that yields approximately optimal results. We also provide tables of key values to help in the design of group sequential tests that meet selected specifications.
我们提出了一类由单个参数索引的序贯检验,其产生近似最优的结果。我们还提供了关键值表,以帮助设计满足选定规格的序贯检验。