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通过高分辨率显带技术检查的85例智力迟钝患者的染色体畸变。

Chromosomal aberrations in 85 mentally retarded patients examined by high resolution banding.

作者信息

Tengström C, Autio S

出版信息

Clin Genet. 1987 Jan;31(1):53-60.

PMID:3568434
Abstract

Eighty-five mentally retarded patients had their chromosomes examined by using the high resolution banding techniques. Fifty-nine of them had multiple congenital anomalies and/or dysmorphic features. Twenty-six had mental retardation but no major anomalies; they were primarily suspected of having the fragile X syndrome. This suspicion was first excluded. Fifteen patients were found to have a chromosome aberration, interpreted as clinically significant. Eleven of them had been examined earlier by conventional methods. The aberrations found were divided into three groups: (I) those detectable with an accuracy of ca. 300-400 bands (N = 4), (II) those detectable with an accuracy of ca. 400-550 bands (N = 6) and (III) those detectable with an accuracy of ca. 550-850 bands (N = 5). The aberrations are described and discussed.

摘要

85名智力迟钝患者采用高分辨率显带技术检查了染色体。其中59名有多种先天性异常和/或畸形特征。26名有智力迟钝但无主要异常;他们最初被怀疑患有脆性X综合征。该怀疑首先被排除。发现15名患者有染色体畸变,被解释为具有临床意义。其中11名此前已用传统方法检查过。发现的畸变分为三组:(I)能在约300 - 400条带水平准确检测到的(N = 4),(II)能在约400 - 550条带水平准确检测到的(N = 6),以及(III)能在约550 - 850条带水平准确检测到的(N = 5)。对这些畸变进行了描述和讨论。

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