Department of Chemistry, Lehigh University, Bethlehem, PA, 18015, USA.
Chem Soc Rev. 2022 Jul 4;51(13):5268-5286. doi: 10.1039/d2cs00096b.
Peak force infrared (PFIR) microscopy is an emerging atomic force microscopy (AFM)-based infrared microscopy that bypasses Abbe's diffraction limit on spatial resolution. The PFIR microscopy utilizes a nanoscopically sharp AFM tip to mechanically detect the tip-enhanced infrared photothermal response of the sample in the time domain. The time-gated mechanical signals of cantilever deflections transduce the infrared absorption of the sample, delivering infrared imaging and spectroscopy capability at sub 10 nm spatial resolution. Both the infrared absorption response and mechanical properties of the sample are obtained in parallel while preserving the surface integrity of the sample. This review describes the constructions of the PFIR microscope and several variations, including multiple-pulse excitation, total internal reflection geometry, dual-color configuration, liquid-phase operations, and integrations with simultaneous surface potential measurement. Representative applications of PFIR microscopy are also included in this review. In the outlook section, we lay out several future directions of innovations in PFIR microscopy and applications in chemical and material research.
峰值力红外（PFIR）显微镜是一种新兴的基于原子力显微镜（AFM）的红外显微镜，它绕过了阿贝对空间分辨率的衍射极限。PFIR 显微镜利用纳米级锋利的 AFM 尖端在时域内机械地检测样品的尖端增强红外光热响应。悬臂梁挠度的时门机械信号转换了样品的红外吸收，以亚 10nm 的空间分辨率提供了红外成像和光谱能力。在保持样品表面完整性的同时，同时获得了样品的红外吸收响应和力学性能。这篇综述描述了 PFIR 显微镜的结构和几种变体，包括多脉冲激发、全内反射几何、双色配置、液相操作以及与同时表面电势测量的集成。该综述还包括 PFIR 显微镜的代表性应用。在展望部分，我们提出了 PFIR 显微镜和化学与材料研究中应用的一些未来创新方向。
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