Department of Chemistry, Lehigh University, 6 E Packer Ave., Bethlehem, PA, 18015, USA.
DFM A/S, Danish National Metrology Institute, Kogle Alle 5, 2970, Hørsholm, Denmark.
Angew Chem Int Ed Engl. 2020 Sep 7;59(37):16083-16090. doi: 10.1002/anie.202004211. Epub 2020 Jun 25.
Correlative scanning probe microscopy of chemical identity, surface potential, and mechanical properties provide insight into the structure-function relationships of nanomaterials. However, simultaneous measurement with comparable and high resolution is a challenge. We seamlessly integrated nanoscale photothermal infrared imaging with Coulomb force detection to form peak force infrared-Kelvin probe force microscopy (PFIR-KPFM), which enables simultaneous nanomapping of infrared absorption, surface potential, and mechanical properties with approximately 10 nm spatial resolution in a single-pass scan. MAPbBr perovskite crystals of different degradation pathways were studied in situ. Nanoscale charge accumulations were observed in MAPbBr near the boundary to PbBr . PFIR-KPFM also revealed correlations between residual charges and secondary conformation in amyloid fibrils. PFIR-KPFM is applicable to other heterogeneous materials at the nanoscale for correlative multimodal characterizations.
化学特性、表面电势和机械性能的相关扫描探针显微镜研究为纳米材料的结构-功能关系提供了深入的了解。然而，具有可比性和高分辨率的同时测量是一个挑战。我们将纳米级光热红外成像与库仑力检测无缝集成，形成峰值力红外-开尔文探针力显微镜（PFIR-KPFM），该技术可在单次扫描中以约 10nm 的空间分辨率对红外吸收、表面电势和机械性能进行纳米级测绘。我们对不同降解途径的 MAPbBr 钙钛矿晶体进行了原位研究。在 MAPbBr 靠近 PbBr 的边界处观察到纳米级的电荷积累。PFIR-KPFM 还揭示了淀粉样纤维中残余电荷与二级构象之间的相关性。PFIR-KPFM 适用于纳米级的其他异质材料，可进行相关的多模态特性分析。
