Yildirim Batuhan, Washington Adam, Doutch James, Cole Jacqueline M
Cavendish Laboratory, Department of Physics, University of Cambridge J. J. Thomson Avenue Cambridge CB3 0HE UK
ISIS Neutron and Muon Source, STFC Rutherford Appleton Laboratory Didcot Oxfordshire OX11 0QX UK.
RSC Adv. 2022 Jun 6;12(26):16656-16662. doi: 10.1039/d2ra00685e. eCollection 2022 Jun 1.
We outline procedures to calculate small-angle scattering (SAS) intensity functions from 2-dimensional electron-microscopy (EM) images. Two types of scattering systems were considered: (a) the sample is a set of particles confined to a plane; or (b) the sample is modelled as parallel, infinitely long cylinders that extend into the image plane. In each case, an EM image is segmented into particle instances and the background, whereby coordinates and morphological parameters are computed and used to calculate the constituents of the SAS-intensity function. We compare our results with experimental SAS data, discuss limitations, both general and case specific, and outline some applications of this method which could potentially complement experimental SAS.
我们概述了从二维电子显微镜（EM）图像计算小角散射（SAS）强度函数的程序。考虑了两种散射系统：（a）样品是一组局限于平面内的粒子；或（b）样品被建模为延伸到图像平面的平行无限长圆柱体。在每种情况下，将EM图像分割为粒子实例和背景，由此计算坐标和形态参数，并用于计算SAS强度函数的组成部分。我们将结果与实验SAS数据进行比较，讨论一般和特定情况下的局限性，并概述该方法的一些应用，这些应用可能潜在地补充实验SAS。
