Deng Hongze, Zhang Chenhui, Liang Weizheng, Zhang Xi-Xiang, Luo Sheng-Nian
The Peac Institute of Multiscale Sciences Chengdu Sichuan People's Republic of China
Physical Science and Engineering Division, King Abdullah University of Science and Technology Thuwal Saudi Arabia.
RSC Adv. 2022 Jun 5;12(26):16479-16485. doi: 10.1039/d2ra01978g. eCollection 2022 Jun 1.
We present a time-resolved ultrafast optical spectroscopy study on BiTeI, a noncentrosymmetric semiconductor with large spin-orbit splitting. By tuning the pump photon energy, hot carriers can be excited into different energy bands, and the hot carriers decay dynamics are measured. The hot carriers excited by an 1.544 eV photon induce a positive differential reflectivity following a single exponential decay, while the hot carriers excited by an 1.651 eV photon show a negative reflectivity following two exponential decays, , the hot carriers excited by 1.544 eV and 1.651 eV photons show different decay dynamics. We also investigate hot carrier dynamics in each Rashba splitting band at the 1.544 eV and 1.651 eV photon pump, and there is no difference in hot carrier decay between the left and right Rashba splitting bands for both cases.
我们展示了一项关于BiTeI的时间分辨超快光学光谱研究,BiTeI是一种具有大自旋轨道分裂的非中心对称半导体。通过调节泵浦光子能量,可以将热载流子激发到不同的能带,并测量热载流子的衰减动力学。由1.544 eV光子激发的热载流子在单指数衰减后诱导出正的微分反射率,而由1.651 eV光子激发的热载流子在双指数衰减后呈现负反射率,即由1.544 eV和1.651 eV光子激发的热载流子表现出不同的衰减动力学。我们还研究了在1.544 eV和1.651 eV光子泵浦下每个Rashba分裂带中的热载流子动力学,并且在这两种情况下,左右Rashba分裂带之间的热载流子衰减没有差异。