Pan Liuyang, Li Shuhui, Cao Jinyu, Wu Jiali, Zhang Zhe, Wang Kun, Huang Qiushi, Ma Bin, Li Wenbin, Wang Zhanshan
MOE Key Laboratory of Advanced Micro-Structured Materials, Shanghai 200092, China.
Institute of Precision Optical Engineering, School of Physics Science and Engineering, Tongji University, Shanghai 200092, China.
Nano Lett. 2022 Jul 13;22(13):5260-5268. doi: 10.1021/acs.nanolett.2c01171. Epub 2022 Jun 27.
An ultrafast time-resolved pump-probe setup with both high temporal and spatial resolution is developed to investigate the transient interaction between a nanosecond extreme ultraviolet (EUV) pulse and matter. By using a delayed femtosecond probe pulse, the pattern evolution of surface modification induced by an EUV pump at a wavelength of 13.5 nm can be imaged at different delay times, which provides deep insight into the EUV-induced damage dynamics and damage mechanisms. As a demonstration, single-shot EUV damage on a BC(6.0 nm)/Ru(30.4 nm)/D263 nano-bilayer optical film is studied using this pump-probe method. A recoverable phenomenon is found during the evolution process of the dome-shaped damage region. This is explained by the elastic and plastic deformations resulting from the huge compressive stress difference at the Ru-substrate interface with the help of simulations on the thermal effects and mechanical responses. This damage mechanism is further proven by the complementary experiments at a higher EUV fluence at 13.5 nm.
为了研究纳秒极紫外(EUV)脉冲与物质之间的瞬态相互作用,开发了一种具有高时间和空间分辨率的超快时间分辨泵浦 - 探测装置。通过使用延迟的飞秒探测脉冲,可以在不同延迟时间对波长为13.5 nm的EUV泵浦引起的表面改性图案演变进行成像,这为深入了解EUV诱导的损伤动力学和损伤机制提供了帮助。作为演示,使用这种泵浦 - 探测方法研究了BC(6.0 nm)/ Ru(30.4 nm)/ D263纳米双层光学薄膜上的单次EUV损伤。在圆顶形损伤区域的演变过程中发现了一种可恢复现象。借助热效应和力学响应的模拟,这可以通过Ru - 衬底界面处巨大的压缩应力差引起的弹性和塑性变形来解释。在13.5 nm更高的EUV通量下进行的补充实验进一步证明了这种损伤机制。