Frazzini Valerio, Cousyn Louis, Navarro Vincent
AP-HP, Department of Neurology and Department of Clinical Neurophysiology, Epilepsy and EEG Unit, Reference Center for Rare Epilepsies, Pitié-Salpêtrière Hospital, Paris, France; Sorbonne Université, Paris Brain Institute, Team "Dynamics of Neuronal Networks and Neuronal Excitability", Paris, France.
AP-HP, Department of Neurology and Department of Clinical Neurophysiology, Epilepsy and EEG Unit, Reference Center for Rare Epilepsies, Pitié-Salpêtrière Hospital, Paris, France; Sorbonne Université, Paris Brain Institute, Team "Dynamics of Neuronal Networks and Neuronal Excitability", Paris, France.
Handb Clin Neurol. 2022;187:489-518. doi: 10.1016/B978-0-12-823493-8.00021-3.
Temporal lobe epilepsy (TLE) is the most common type of focal epilepsy. First descriptions of TLE date back in time and detailed portraits of epileptic seizures of temporal origin can be found in early medical reports as well as in the works of various artists and dramatists. Depending on the seizure onset zone, several subtypes of TLE have been identified, each one associated with peculiar ictal semiology. TLE can result from multiple etiological causes, ranging from genetic to lesional ones. While the diagnosis of TLE relies on detailed analysis of clinical as well as electroencephalographic (EEG) features, the lesions responsible for seizure generation can be highlighted by multiple brain imaging modalities or, in selected cases, by genetic investigations. TLE is the most common cause of refractory epilepsy and despite the great advances in diagnostic tools, no lesion is found in around one-third of patients. Surgical treatment is a safe and effective option, requiring presurgical investigations to accurately identify the seizure onset zone (SOZ). In selected cases, presurgical investigations need intracerebral investigations (such as stereoelectroencephalography) or dedicated metabolic imaging techniques (interictal PET and ictal SPECT) to correctly identify the brain structures to be removed.
颞叶癫痫(TLE)是最常见的局灶性癫痫类型。对TLE的首次描述可追溯到很久以前,在早期医学报告以及众多艺术家和剧作家的作品中都能找到对颞叶起源癫痫发作的详细描述。根据癫痫发作起始区,已确定了几种TLE亚型,每种亚型都与独特的发作期症状学相关。TLE可由多种病因引起,从遗传因素到损伤因素不等。虽然TLE的诊断依赖于对临床特征以及脑电图(EEG)特征的详细分析,但导致癫痫发作的病变可通过多种脑成像方式或在特定情况下通过基因检测得以凸显。TLE是难治性癫痫最常见的病因,尽管诊断工具取得了巨大进展,但约三分之一的患者未发现病变。手术治疗是一种安全有效的选择,需要进行术前检查以准确识别癫痫发作起始区(SOZ)。在特定情况下,术前检查需要进行脑内检查(如立体脑电图)或专门的代谢成像技术(发作间期PET和发作期SPECT)以正确识别需要切除的脑结构。