Majkrzak C F, Berk N F, Maranville B B, Dura J A, Jach T
Center for Neutron Research, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, MD 20899, USA.
Materials Measurement Laboratory, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, MD 20899, USA.
J Appl Crystallogr. 2022 Jun 23;55(Pt 4):787-812. doi: 10.1107/S160057672200440X. eCollection 2022 Aug 1.
In the analysis of neutron scattering measurements of condensed matter structure, it normally suffices to treat the incident and scattered neutron beams as if composed of incoherent distributions of plane waves with wavevectors of different magnitudes and directions that are taken to define an instrumental resolution. However, despite the wide-ranging applicability of this conventional treatment, there are cases, such as specular neutron reflectometry, in which the structural length scales of the scattering object require that the wavefunction of an individual neutron in the beam be described by a spatially localized packet - in particular with respect to the transverse extent of its wavefronts ( normal to the packet's mean direction of propagation). It is shown in the present work that neutron diffraction patterns observed for periodic transmission phase gratings, as well as specular reflection measurements from patterned thin films with repeat units of the order of micrometres, can be accurately described by associating an individual neutron with a wave packet and treating a beam as a collection of independent packets. In these cases, accurate analysis requires that the transverse spatial extent of a neutron packet wavefront be accounted for in addition to the angular divergence of the beam that is characterized by a distribution of packet mean wavevector directions. It is shown how a measure of the effective transverse spatial extent of the neutron packet - over which its wavefronts are of sufficient uniformity to produce coherent scattering - can be determined by employing reference diffraction gratings and patterned thin films of known structure and composition.
在对凝聚态物质结构的中子散射测量分析中,通常可以将入射中子束和散射中子束当作由具有不同大小和方向波矢的平面波的非相干分布组成,这些波矢用于定义仪器分辨率。然而,尽管这种传统处理方法具有广泛的适用性,但在某些情况下,如镜面中子反射测量,散射物体的结构长度尺度要求束中单个中子的波函数由空间局域化的波包来描述——特别是相对于其波前的横向范围(垂直于波包的平均传播方向)。本工作表明,对于周期性透射相位光栅观察到的中子衍射图案,以及从具有微米级重复单元的图案化薄膜进行的镜面反射测量,可以通过将单个中子与一个波包相关联并将束当作独立波包的集合来准确描述。在这些情况下,准确的分析要求除了以波包平均波矢方向分布为特征的束的角发散之外,还要考虑中子包波前的横向空间范围。展示了如何通过使用已知结构和组成的参考衍射光栅和图案化薄膜来确定中子包有效横向空间范围的度量,在该范围内其波前具有足够的均匀性以产生相干散射。