在与流体储层接触的软凝聚态物质薄膜的中子反射测量研究中进行精确的背景校正。
Accurate background correction in neutron reflectometry studies of soft condensed matter films in contact with fluid reservoirs.
作者信息
Hoogerheide David P, Heinrich Frank, Maranville Brian B, Majkrzak Charles F
机构信息
Center for Neutron Research, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.
Department of Physics, Carnegie Mellon University, Pittsburgh, PA 15213, USA.
出版信息
J Appl Crystallogr. 2020;53(1). doi: 10.1107/s160057671901481x.
Neutron reflectometry (NR) is a powerful method for looking at the structures of multilayered thin films, including biomolecules on surfaces, particularly proteins at lipid interfaces. The spatial resolution of the film structure obtained through an NR experiment is limited by the maximum wavevector transfer at which the reflectivity can be measured. This maximum is in turn determined primarily by the scattering background, from incoherent scattering from a liquid reservoir or inelastic scattering from cell materials. Thus, reduction of scattering background is an important part of improving the spatial resolution attainable in NR measurements. Here, the background field generated by scattering from a thin liquid reservoir on a monochromatic reflectometer is measured and calculated. It is shown that background subtraction utilizing the entire background field improves data modeling and reduces experimental uncertainties associated with localized background subtraction.
中子反射测量法（NR）是一种用于研究多层薄膜结构的强大方法，这些薄膜包括表面的生物分子，特别是脂质界面处的蛋白质。通过NR实验获得的薄膜结构的空间分辨率受到可测量反射率的最大波矢转移的限制。而这个最大值又主要由散射背景决定，散射背景来自液体储库的非相干散射或细胞材料的非弹性散射。因此，降低散射背景是提高NR测量中可实现的空间分辨率的重要环节。在此，对单色反射仪上薄液体储库散射产生的背景场进行了测量和计算。结果表明，利用整个背景场进行背景扣除可改善数据建模，并减少与局部背景扣除相关的实验不确定性。
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