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硅超表面在可见光范围内的聚焦特性和宽视场成像性能

Focusing Characteristics and Widefield Imaging Performance of the Silicon Metalens in the Visible Range.

作者信息

Zhao Miao, Yu Binbin, Du Jing, Wen Jing

机构信息

Laboratory of Micro-Nano Optoelectronic Materials and Devices, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China.

Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China.

出版信息

Micromachines (Basel). 2022 Jul 27;13(8):1183. doi: 10.3390/mi13081183.

Abstract

Conventional optical high numerical aperture lenses are essential for high-resolution imaging, but bulky and expensive. In comparison, metalens-based optical components are the subjects of intensive investigation for their flexible manipulation of light. Methods of detecting and characterizing focal spots and scanning imaging produced by metalenses are well established. However, widefield imaging by metalenses is experimentally challenging. This study demonstrates the design and realization of silicon-based metalenses with numerical apertures of 0.447 and 0.204 in the broadband spectrum of 580-780 nm for microscopic widefield imaging. The optimized aspect ratio of the single nanorod is 5.1:1, which reduces the fabrication difficulty compared to other, more complicated designs and fabrication. Furthermore, we successfully demonstrate widefield imaging by the designed metalens and compare the simulated and the experimentally extracted modulation transfer function curves of the metalens.

摘要

传统的光学高数值孔径透镜对于高分辨率成像至关重要,但体积庞大且价格昂贵。相比之下,基于超表面的光学元件因其对光的灵活操控而成为深入研究的对象。检测和表征超表面产生的焦点及扫描成像的方法已很成熟。然而,利用超表面进行宽场成像在实验上具有挑战性。本研究展示了用于微观宽场成像的硅基超表面的设计与实现,其在580 - 780 nm宽带光谱中的数值孔径分别为0.447和0.204。单个纳米棒的优化长宽比为5.1:1,与其他更复杂的设计和制造相比,降低了制造难度。此外,我们成功展示了所设计超表面的宽场成像,并比较了超表面的模拟调制传递函数曲线和实验提取的调制传递函数曲线。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/0275/9413690/6b5c24957ddf/micromachines-13-01183-g001.jpg

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