Orend Kerstin, Baer Christoph, Musch Thomas
Institute of Electronic Circuits, Ruhr University Bochum, 44801 Bochum, Germany.
Sensors (Basel). 2022 Aug 10;22(16):5972. doi: 10.3390/s22165972.
In this contribution, we present a measurement system for material characterization in the millimeter-wave range that requires extremely small amounts of sample material. With the help of a dielectric waveguide, it is possible to measure the complete S-parameters with only one port. Fundamentals regarding dielectric waveguides and algorithms are explained, which form the basis of the measurement system. Within the scope of this work, an existing waveguide system was extended and optimized. In addition, two algorithms were implemented to determine permittivity. Finally, measurements were carried out to prove the function of the measurement setup and compared to existing measurement setups.
在本论文中，我们展示了一种用于毫米波范围内材料特性表征的测量系统，该系统仅需极少量的样品材料。借助介质波导，仅通过一个端口就可以测量完整的S参数。文中解释了介质波导和算法的基本原理，它们构成了测量系统的基础。在本工作范围内，对现有的波导系统进行了扩展和优化。此外，还实现了两种用于确定介电常数的算法。最后，进行了测量以证明测量装置的功能，并与现有的测量装置进行了比较。
