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具有并联耦合热电元件的薄膜热电冷却器的模拟冷却性能。

The simulated cooling performance of a thin-film thermoelectric cooler with coupled-thermoelements connected in parallel.

作者信息

Ming Tingzhen, Chen Sen, Yan Yonggao, Gong Tingrui, Wan Jianlong, Wu Yongjia

机构信息

School of Civil Engineering and Architecture, Wuhan University of Technology, Wuhan 430070, Hubei, China.

School of Architectural Engineering, Huanggang Normal University, No. 146 Xingang Second Road, Huanggang 438000, China.

出版信息

Heliyon. 2022 Aug 2;8(8):e10025. doi: 10.1016/j.heliyon.2022.e10025. eCollection 2022 Aug.

Abstract

The thermoelements of the traditional thin-film thermoelectric cooler (TEC) are connected electrically in series, thus the performance of traditional thin-film TEC reduces sharply when there is something wrong with any thermoelement. On account of this deficiency, we proposed a novel thin-film TEC with a couple of thermoelements electrically connected in parallel and then electrically connected in series to the next couple of thermoelements. The performance and reliability of the novel thin-film TEC is compared with the traditional thin-film TEC. The maximum cooling capacity, the maximum cooling temperature, and the coefficient of performance of the novel and the traditional thin-film TEC are systematically studied and compared when 0, 2, and 4 thermoelements are disabled, respectively. The results show that the performance and reliability of the novel thin-film TEC are superior to that of the traditional thin-film TEC, while the optimal electric current of the novel thin-film TEC current is 2.14 times of that for the traditional thin-film TEC. This work is of great significance to improving the performance and reliability of thin-film thermoelectric devices consisting of dozens of small thermoelements.

摘要

传统薄膜热电冷却器(TEC)的热电偶是串联电连接的,因此当任何一个热电偶出现问题时,传统薄膜TEC的性能会急剧下降。鉴于这一缺陷,我们提出了一种新型薄膜TEC,其中一对热电偶并联电连接,然后与下一对热电偶串联电连接。将新型薄膜TEC的性能和可靠性与传统薄膜TEC进行了比较。分别在0个、2个和4个热电偶失效时,系统地研究和比较了新型和传统薄膜TEC的最大制冷量、最大制冷温度和性能系数。结果表明,新型薄膜TEC的性能和可靠性优于传统薄膜TEC,而新型薄膜TEC的最佳电流是传统薄膜TEC的2.14倍。这项工作对于提高由数十个小热电偶组成的薄膜热电器件的性能和可靠性具有重要意义。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7c99/9399165/dfd7d12635ab/gr1.jpg

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