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/ 缺陷CoO纳米片析氧反应中Co中间体的软X射线光谱鉴定

/ Soft X-ray Spectroscopic Identification of a Co Intermediate in the Oxygen Evolution Reaction of Defective CoO Nanosheets.

作者信息

Huang Yu-Cheng, Chen Wei, Xiao Zhaohui, Hu Zhiwei, Lu Ying-Rui, Chen Jeng-Lung, Chen Chi-Liang, Lin Hong-Ji, Chen Chien-Te, Arul K Thanigai, Wang Shuangyin, Dong Chung-Li, Chou Wu-Ching

机构信息

Department of Electrophysics, National Yang Ming Chiao Tung University, Hsinchu 30010, Taiwan.

Research Center for X-ray Science & Department of Physics, Tamkang University, New Taipei City 25137, Taiwan.

出版信息

J Phys Chem Lett. 2022 Sep 8;13(35):8386-8396. doi: 10.1021/acs.jpclett.2c01557. Epub 2022 Sep 1.

Abstract

Defect engineering is an important means of improving the electrochemical performance of the CoO electrocatalyst in the oxygen evolution reaction (OER). In this study, soft X-ray absorption spectroscopy (SXAS) is used to explore the electronic structure of CoO under OER for the first time. The defect-rich CoO (D-CoO) has a Co state with Co at both octahedral (O) and tetrahedral (T) sites and Co at O, whereas CoO has Co with Co and Co at T and O sites, respectively. SXAS reveals that upon increasing the voltage, the Co in D-CoO is converted to low-spin Co, some of which is further converted to low-spin Co; most Co in CoO is converted to Co but rarely to Co. When the voltage is switched off, Co intermediates quickly disappear. These findings reveal Co(O) in D-CoO can be rapidly converted to active low-spin Co under conditions, which cannot be observed by XAS.

摘要

缺陷工程是提高CoO电催化剂在析氧反应(OER)中电化学性能的重要手段。在本研究中,首次使用软X射线吸收光谱(SXAS)来探究OER条件下CoO的电子结构。富含缺陷的CoO(D-CoO)具有八面体(O)和四面体(T)位点均为Co的Co态以及O位点的Co,而CoO分别在T和O位点具有Co和Co。SXAS表明,随着电压增加,D-CoO中的Co转变为低自旋Co,其中一些进一步转变为低自旋Co;CoO中的大多数Co转变为Co,但很少转变为Co。当关闭电压时,Co中间体迅速消失。这些发现揭示了D-CoO中的Co(O)在特定条件下可迅速转变为活性低自旋Co,这是XAS无法观察到的。

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