Levcenko S, Biller R, Pfeiffelmann T, Ritter K, Falk H H, Wang T, Siebentritt S, Welter E, Schnohr C S
Felix-Bloch-Institut für Festkörperphysik, Universität Leipzig, Linnéstraße 5, 04103 Leipzig, Germany.
Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607 Hamburg, Germany.
J Synchrotron Radiat. 2022 Sep 1;29(Pt 5):1209-1215. doi: 10.1107/S1600577522007287. Epub 2022 Aug 11.
A newly designed setup to perform steady-state X-ray excited optical luminescence (XEOL) spectroscopy and simultaneous XEOL and X-ray absorption spectroscopy characterization at beamline P65 of PETRA III is described. The XEOL setup is equipped with a He-flow cryostat and state-of-the-art optical detection system, which covers a wide wavelength range of 300-1700 nm with a high spectral resolution of 0.4 nm. To demonstrate the setup functioning, low-temperature XEOL studies on polycrystalline CuInSe thin film, single-crystalline GaN thin film and single-crystalline ZnO bulk semiconductor samples are performed.
本文描述了一种新设计的装置，用于在PETRA III的P65光束线上进行稳态X射线激发光致发光（XEOL）光谱以及同时进行XEOL和X射线吸收光谱表征。该XEOL装置配备了氦气流低温恒温器和先进的光学检测系统，其覆盖300 - 1700 nm的宽波长范围，光谱分辨率高达0.4 nm。为了展示该装置的功能，对多晶CuInSe薄膜、单晶GaN薄膜和单晶ZnO块状半导体样品进行了低温XEOL研究。
