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基于表面等离激元极化激元介导的用于改进亚波长成像的双层金属超透镜的严格分析与系统设计。

Rigorous Analysis and Systematical Design of Double-Layer Metal Superlens for Improved Subwavelength Imaging Mediated by Surface Plasmon Polaritons.

作者信息

Wang Jing, Li Zhichao, Liu Weina

机构信息

Costar (Shanghai) Science & Technology Co., Ltd., Shanghai 200241, China.

Institute of Advanced Optics, China South Industries Group Corporation, Nanyang 473000, China.

出版信息

Nanomaterials (Basel). 2022 Oct 11;12(20):3553. doi: 10.3390/nano12203553.

Abstract

A double-layer metal superlens was rigorously analyzed and systematically designed to improve subwavelength imaging ability. It was revealed that transmission properties of the imaging system could be accurately interpreted by the five-layer waveguide mode theory-each amplification peak among the spatial frequency range of evanescent waves was associated with a corresponding surface plasmon polariton (SPP) mode of an insulator-metal-insulator-metal-insulator (IMIMI) structure. On the basis of such physical insight, evanescent waves of higher spatial frequency were effectively amplified via increasing propagation constants of symmetrically coupled short-range SPP (s-SRSPP) and antisymmetrically coupled short-range SPP (a-SRSPP), and evanescent waves of lower spatial frequency were appropriately diminished by approaching to cut off symmetrically coupled long-range SPP (s-LRSPP). A flat and broad optical transfer function of the imaging system was then achieved, and improved subwavelength imaging performance was validated by imaging an ideal thin object of two slits with a 20-nm width distanced by a 20-nm spacer, under 193-nm illumination. The resolution limit of the designed imaging system with double-layer superlens was further demonstrated to be at least ~λ/16 for an isolated two-slit object model. This work provided sound theoretical analysis and a systematic design approach of double-layer metal superlens for near-field subwavelength imaging, such as fluorescent micro/nanoscopy or plasmonic nanolithography.

摘要

为提高亚波长成像能力,对双层金属超透镜进行了严格分析和系统设计。结果表明,成像系统的传输特性可以用五层波导模式理论准确解释——在倏逝波空间频率范围内的每个放大峰都与绝缘体-金属-绝缘体-金属-绝缘体(IMIMI)结构的相应表面等离激元极化激元(SPP)模式相关。基于这种物理见解,通过增加对称耦合短程SPP(s-SRSPP)和反对称耦合短程SPP(a-SRSPP)的传播常数,有效地放大了更高空间频率的倏逝波,并且通过接近截止对称耦合长程SPP(s-LRSPP)来适当减小较低空间频率的倏逝波。然后实现了成像系统平坦且宽广的光学传递函数,并在193nm照明下对一个由20nm间隔隔开的20nm宽的双缝理想薄物体进行成像,验证了改进的亚波长成像性能。对于孤立的双缝物体模型,具有双层超透镜的设计成像系统的分辨率极限进一步证明至少为~λ/16。这项工作为近场亚波长成像,如荧光微/纳米显微镜或等离子体纳米光刻,提供了双层金属超透镜的可靠理论分析和系统设计方法。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6431/9612018/7c2d96870dce/nanomaterials-12-03553-g001.jpg

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