Samadi Nazanin, Shi Xianbo, Ozkan Loch Cigdem, Krempasky Juraj, Boege Michael, Chapman Dean, Stampanoni Marco
Paul Scherrer Institute (PSI), 5232, Villigen, Switzerland.
Advanced Photon Source, Argonne National Laboratory, Lemont, IL, 60439, USA.
Sci Rep. 2022 Oct 29;12(1):18267. doi: 10.1038/s41598-022-23004-3.
The advent of low-emittance synchrotron X-ray sources and free-electron lasers urges the development of novel diagnostic techniques for measuring and monitoring the spatial source properties, especially the source sizes. This work introduces an X-ray beam property analyzer based on a multi-crystal diffraction geometry, including a crystal-based monochromator and a Laue crystal in a dispersive setting to the monochromator. By measuring the flat beam and the transmitted beam profiles, the system can provide a simultaneous high-sensitivity characterization of the source size, divergence, position, and angle in the diffraction plane of the multi-crystal system. Detailed theoretical modeling predicts the system's feasibility as a versatile characterization tool for monitoring the X-ray source and beam properties. The experimental validation was conducted at a bending magnet beamline at the Swiss Light Source by varying the machine parameters. A measurement sensitivity of less than 10% of a source size of around 12 µm is demonstrated. The proposed system offers a compact setup with simple X-ray optics and can also be utilized for monitoring the electron source.
低发射率同步加速器X射线源和自由电子激光的出现促使人们开发用于测量和监测空间源特性，特别是源尺寸的新型诊断技术。这项工作介绍了一种基于多晶体衍射几何结构的X射线束特性分析仪，包括一个基于晶体的单色仪和一个在色散设置下与单色仪相连的劳厄晶体。通过测量平面光束和透射光束轮廓，该系统可以同时对多晶体系统衍射平面中的源尺寸、发散度、位置和角度进行高灵敏度表征。详细的理论建模预测了该系统作为监测X射线源和光束特性的通用表征工具的可行性。通过改变机器参数，在瑞士光源的弯铁光束线进行了实验验证。结果表明，测量灵敏度低于约12微米源尺寸的10%。所提出的系统提供了一个具有简单X射线光学元件的紧凑设置，还可用于监测电子源。
