Shi Xianbo, Qiao Zhi, Pradhan Paresh, Liu Peifan, Assoufid Lahsen, Kim Kwang Je, Shvyd'ko Yuri
Argonne National Laboratory, 9700 South Cass Avenue, Lemont, IL 60439, USA.
J Synchrotron Radiat. 2023 Nov 1;30(Pt 6):1100-1107. doi: 10.1107/S1600577523007531. Epub 2023 Oct 10.
The advent of next-generation synchrotron radiation sources and X-ray free-electron lasers calls for high-quality Bragg-diffraction crystal optics to preserve the X-ray beam coherence and wavefront. This requirement brings new challenges in characterizing crystals in Bragg diffraction in terms of Bragg-plane height errors and wavefront phase distortions. Here, a quantitative methodology to characterize crystal optics using a state-of-the-art at-wavelength wavefront sensing technique and statistical analysis is proposed. The method was tested at the 1-BM-B optics testing beamline at the Advanced Photon Source for measuring silicon and diamond crystals in a self-referencing single-crystal mode and an absolute double-crystal mode. The phase error sensitivity of the technique is demonstrated to be at the λ/100 level required by most applications, such as the characterization of diamond crystals for cavity-based X-ray free-electron lasers.
下一代同步辐射源和X射线自由电子激光的出现，需要高质量的布拉格衍射晶体光学器件来保持X射线束的相干性和波前。这一要求在根据布拉格平面高度误差和波前相位畸变来表征布拉格衍射中的晶体方面带来了新的挑战。在此，提出了一种使用先进的波长波前传感技术和统计分析来表征晶体光学器件的定量方法。该方法在先进光子源的1-BM-B光学测试束线上进行了测试，用于在自参考单晶模式和绝对双晶模式下测量硅晶体和金刚石晶体。该技术的相位误差灵敏度被证明达到了大多数应用所需的λ/100水平，如用于基于腔的X射线自由电子激光的金刚石晶体表征。
