Zhang Honghui, Xu Hongyan, Liu Xuan, Xu Ju
Xinyang Vocational and Technical College Xinyang 464000 China
Micro-nano Fabrication Technology Department, Institute of Electronic Engineering, Chinese Academy of Sciences Beijing 100190 China
RSC Adv. 2022 Oct 12;12(45):29063-29069. doi: 10.1039/d2ra04606g. eCollection 2022 Oct 11.
In this study, a novel Cu@Sn TLPS joint was fabricated for high-temperature power electronics application. Cu@Sn core-shell composite powder was firstly prepared by a methylate electroplating method, and then pressed into a preformed sheet. The Cu@Sn preform was reflowed at 250 ∼ 280 °C for 40 min under the pressure of 0.1 × 10 MPa, and the resulting bondline can withstand high temperatures up to 600 °C. During the process, the Sn layer was transformed to CuSn, and the CuSn surrounded the outside of the residual Cu particles. The joint characteristics were controlled by size gradation of Cu particles, the ratio of Cu/Sn, preform forming pressure and TLPS process. The joint shear strength was no less than 48 MPa after aging at 400 °C for 1000 h. Young's modulus and hardness were 98.35 GPa and 2.62 GPa, respectively, which are much lower than the pure CuSn joint. The electrical resistivity and thermal conductivity of the joint were 5.1 μΩ cm and 148 W m K, respectively. It is superior to pure CuSn joints and the other Cu/Sn system TLPS joints. The high shear strength, high thermal conductivity and high melting temperature demonstrate that Cu@Sn TLPS joint is a promising interconnect technology for high power density modules.
在本研究中,制备了一种用于高温电力电子应用的新型Cu@Sn瞬态液相烧结(TLPS)接头。首先通过甲基化电镀法制备Cu@Sn核壳复合粉末,然后将其压制成预制片。将Cu@Sn预制片在0.1×10 MPa的压力下于250~280℃回流40分钟,所得的结合线能够承受高达600℃的高温。在此过程中,Sn层转变为CuSn,CuSn包围了残余Cu颗粒的外部。接头特性由Cu颗粒的尺寸级配、Cu/Sn比例、预制片成型压力和TLPS工艺控制。在400℃时效1000小时后,接头的剪切强度不低于48 MPa。杨氏模量和硬度分别为98.35 GPa和2.62 GPa,远低于纯CuSn接头。接头的电阻率和热导率分别为5.1 μΩ·cm和148 W/(m·K)。它优于纯CuSn接头和其他Cu/Sn体系的TLPS接头。高剪切强度、高导热率和高熔点表明Cu@Sn TLPS接头是一种用于高功率密度模块的有前途的互连技术。