Suppr超能文献

Defect-Induced Ultrafast Nonadiabatic Electron-Hole Recombination Process in PtSe Monolayer.

作者信息

Huang Hongfu, Peng Junhao, Li Zixuan, Dong Huafeng, Huang Le, Wen Minru, Wu Fugen

机构信息

School of Physics and Optoelectronic Engineering, Guangdong University of Technology, Guangzhou510006, China.

Guangdong Provincial Key Laboratory of Information Photonics Technology, Guangdong University of Technology, Guangzhou510006, China.

出版信息

J Phys Chem Lett. 2022 Dec 1;13(47):10988-10993. doi: 10.1021/acs.jpclett.2c03306. Epub 2022 Nov 20.

Abstract

Defects are inevitable in two-dimensional materials due to the growth condition, which results in many unexpected changes in materials' properties. Here, we have mainly discussed the nonradiative recombination dynamics of PtSe monolayer without/with native point defects. Based on first-principles calculations, a shallow p-type defect state is introduced by a Se antisite, and three n-type defect states with a double-degenerate shallow defect state and a deep defect state are introduced by a Se vacancy. Significantly, these defect states couple strongly to the pristine valence band maximum and lead to the enhancement of the in-plane vibrational E mode. Both factors appreciably increase the nonadiabatic coupling, accelerating the electron-hole recombination process. An explanation of PtSe-based photodetectors with the slow response, compared to conventional devices, is provided by studying this nonradiative transitions process.

摘要

文献AI研究员

20分钟写一篇综述,助力文献阅读效率提升50倍。

立即体验

用中文搜PubMed

大模型驱动的PubMed中文搜索引擎

马上搜索

文档翻译

学术文献翻译模型,支持多种主流文档格式。

立即体验