Zhang Tianyi, Liu Mingzu, Fujisawa Kazunori, Lucking Michael, Beach Kory, Zhang Fu, Shanmugasundaram Maruda, Krayev Andrey, Murray William, Lei Yu, Yu Zhuohang, Sanchez David, Liu Zhiwen, Terrones Humberto, Elías Ana Laura, Terrones Mauricio
Department of Materials Science and Engineering, The Pennsylvania State University, University Park, PA, 16802, USA.
Center for 2-Dimensional and Layered Materials, The Pennsylvania State University, University Park, PA, 16802, USA.
Small. 2023 Feb;19(6):e2205800. doi: 10.1002/smll.202205800. Epub 2023 Jan 1.
The ability to control the density and spatial distribution of substitutional dopants in semiconductors is crucial for achieving desired physicochemical properties. Substitutional doping with adjustable doping levels has been previously demonstrated in 2D transition metal dichalcogenides (TMDs); however, the spatial control of dopant distribution remains an open field. In this work, edge termination is demonstrated as an important characteristic of 2D TMD monocrystals that affects the distribution of substitutional dopants. Particularly, in chemical vapor deposition (CVD)-grown monolayer WS , it is found that a higher density of transition metal dopants is always incorporated in sulfur-terminated domains when compared to tungsten-terminated domains. Two representative examples demonstrate this spatial distribution control, including hexagonal iron- and vanadium-doped WS monolayers. Density functional theory (DFT) calculations are further performed, indicating that the edge-dependent dopant distribution is due to a strong binding of tungsten atoms at tungsten-zigzag edges, resulting in the formation of open sites at sulfur-zigzag edges that enable preferential dopant incorporation. Based on these results, it is envisioned that edge termination in crystalline TMD monolayers can be utilized as a novel and effective knob for engineering the spatial distribution of substitutional dopants, leading to in-plane hetero-/multi-junctions that display fascinating electronic, optoelectronic, and magnetic properties.
控制半导体中替代掺杂剂的密度和空间分布的能力对于实现所需的物理化学性质至关重要。先前已在二维过渡金属二硫属化物(TMD)中证明了具有可调掺杂水平的替代掺杂;然而,掺杂剂分布的空间控制仍然是一个未开发的领域。在这项工作中,边缘终止被证明是二维TMD单晶的一个重要特征,它会影响替代掺杂剂的分布。特别是,在化学气相沉积(CVD)生长的单层WS中,发现与钨端域相比,过渡金属掺杂剂在硫端域中的掺入密度总是更高。两个代表性的例子展示了这种空间分布控制,包括六边形铁掺杂和钒掺杂的WS单层。进一步进行了密度泛函理论(DFT)计算,表明边缘依赖的掺杂剂分布是由于钨锯齿边缘处钨原子的强结合,导致硫锯齿边缘处形成空位,从而使掺杂剂优先掺入。基于这些结果,可以设想晶体TMD单层中的边缘终止可以用作设计替代掺杂剂空间分布的新颖有效手段,从而形成具有迷人电子、光电和磁性特性的面内异质/多结。