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一种采用石墨烯作为横向馈通的具有高密封性能的片上微尺度真空腔室。

An On-Chip Microscale Vacuum Chamber with High Sealing Performance Using Graphene as Lateral Feedthrough.

作者信息

Yu Panpan, Zhan Fangyuan, Rao Weidong, Zhao Yanqing, Fang Zheng, Tu Zidong, Li Zhiwei, Guo Dengzhu, Wei Xianlong

机构信息

Hunan Institute of Advanced Sensing and Information Technology, Xiangtan University, Xiangtan 411105, China.

School of Electronics, Peking University, Beijing 100871, China.

出版信息

Micromachines (Basel). 2022 Dec 29;14(1):84. doi: 10.3390/mi14010084.

DOI:10.3390/mi14010084
PMID:36677145
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC9864462/
Abstract

On-chip microscale vacuum chambers with high sealing performance and electrical feedthroughs are highly desired for microscale vacuum electronic devices and other MEMS devices. In this paper, we report an on-chip microscale vacuum chamber which achieves a high sealing performance by using monolayer graphene as lateral electrical feedthrough. A vacuum chamber with the dimensions of π × 2 mm × 2 mm × 0.5 mm is fabricated by anodically bonding a glass chip with a through-hole between two Si chips in a vacuum, after monolayer graphene electrodes have been transferred to the surface of one of the Si chips. Benefiting from the atomic thickness of monolayer graphene, the leak rate of Si-glass bonding interface with a monolayer graphene feedthrough is measured at less than 2 × 10 Pa·m/s. The monolayer graphene feedthrough exhibits a minor resistance increase from 22.5 Ω to 31 Ω after anodic bonding, showing good electrical conductance. The pressure of the vacuum chamber is estimated to be 185 Pa by measuring the breakdown voltage. Such a vacuum is found to maintain for more than 50 days without obvious degradation, implying a high sealing performance with a leak rate of less than 1.02 × 10 Pa·m/s.

摘要

对于微尺度真空电子器件和其他微机电系统(MEMS)器件而言,具有高密封性能和电馈通的片上微尺度真空腔室是非常需要的。在本文中,我们报道了一种片上微尺度真空腔室,它通过使用单层石墨烯作为横向电馈通来实现高密封性能。在将单层石墨烯电极转移到其中一个硅芯片表面后,通过在真空中将带有通孔的玻璃芯片与两个硅芯片进行阳极键合,制造出尺寸为π×2毫米×2毫米×0.5毫米的真空腔室。受益于单层石墨烯的原子厚度,带有单层石墨烯馈通的硅 - 玻璃键合界面的泄漏率测得小于2×10帕·米/秒。单层石墨烯馈通在阳极键合后电阻从22.5Ω略微增加到31Ω,显示出良好的导电性。通过测量击穿电压估计真空腔室的压力为185帕。发现这样的真空可以维持超过50天而没有明显降解,这意味着泄漏率小于1.02×10帕·米/秒的高密封性能。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/8958/9864462/1dbe03468711/micromachines-14-00084-g004.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/8958/9864462/89df93d97bef/micromachines-14-00084-g001.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/8958/9864462/5763efad361a/micromachines-14-00084-g002.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/8958/9864462/e11d682cc9ac/micromachines-14-00084-g003.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/8958/9864462/1dbe03468711/micromachines-14-00084-g004.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/8958/9864462/89df93d97bef/micromachines-14-00084-g001.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/8958/9864462/5763efad361a/micromachines-14-00084-g002.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/8958/9864462/e11d682cc9ac/micromachines-14-00084-g003.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/8958/9864462/1dbe03468711/micromachines-14-00084-g004.jpg

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