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利用核心损耗电子能量损失谱(EELS)以高空间分辨率识别和成像聚合物功能。

Identifying and imaging polymer functionality at high spatial resolution with core-loss EELS.

机构信息

Research, ExxonMobil Technology and Engineering Company, USA.

Center for Electron Microscopy and Analysis, The Ohio State University, USA.

出版信息

Ultramicroscopy. 2023 Apr;246:113688. doi: 10.1016/j.ultramic.2023.113688. Epub 2023 Jan 18.

Abstract

Electron energy loss spectroscopy (EELS) is a proven tool for probing materials chemistry at high spatial resolution. Core-loss EELS fine structure should allow measurement of local polymer chemistry. For organic materials, sensitivity to radiolysis is expected to limit the resolution achievable with EELS: but core-loss EELS has proven difficult at any resolution, yielding inconsistent spectra that compare unfavorably with theoretically analogous x-ray absorption spectra. Many of the previously identified shortcomings should not be limiting factors on modern equipment. This study establishes that EELS can generate identifiable carbon K-edge spectra for a range of common polymer types and chemistry, and demonstrates fine structure features matching prior x-ray absorption spectra. EELS fine structure features broaden intuitively with the instrument's energy resolution, and beam-induced features are readily differentiated by collecting spectra at a series of doses. The results are demonstrated with spectrum images of a model polymer blend, and used to estimate practical pixel sizes that can be used for mapping core-loss EELS as a function of electron dose.

摘要

电子能量损失谱(EELS)是一种经过验证的工具,可用于以高空间分辨率探测材料化学。 芯损失 EELS 精细结构应允许测量局部聚合物化学。 对于有机材料,预计对辐射分解的敏感性将限制 EELS 可达到的分辨率:但是,芯损失 EELS 已经在任何分辨率下都证明是困难的,产生的不一致的光谱与理论上类似的 X 射线吸收光谱相比不利。 以前确定的许多缺点不应成为现代设备的限制因素。 本研究表明,EELS 可以为一系列常见的聚合物类型和化学物质生成可识别的碳 K 边谱,并证明与先前的 X 射线吸收光谱匹配的精细结构特征。 EELS 精细结构特征随着仪器的能量分辨率直观地变宽,并且通过在一系列剂量下收集光谱可以很容易地区分束致特征。 用模型聚合物共混物的光谱图像演示了结果,并用于估计可以用于映射作为电子剂量函数的芯损失 EELS 的实际像素尺寸。

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