TU Wien, Institute of Chemical Technologies and Analytics, Getreidemarkt 9/164-I(2)AC, 1060 Vienna, Austria; KAI Kompetenzzentrum Automobil- und Industrieelektronik GmbH, Technologiepark Villach - Europastraße 8, 8524 Villach, Austria.
TU Wien, Institute of Chemical Technologies and Analytics, Getreidemarkt 9/164-I(2)AC, 1060 Vienna, Austria.
Talanta. 2023 May 1;256:124305. doi: 10.1016/j.talanta.2023.124305. Epub 2023 Jan 26.
In the last years, LA-ICP-MS has become an attractive technique for analyzing solid samples from various research fields. However, application in material science is often hampered by the limited availability of appropriate certified reference materials, which are a precondition for accurate quantification. Thus, frequently in-house prepared standards are used, which match the sample's composition and include all elements of interest at the required concentration levels. However, preparing and characterizing such standards is often labor-intensive and time-consuming. This work proposes a new approach for the fabrication of matrix-matched standards based on the concept of standard addition. In the first step, the analytes of interest are homogeneously deposited onto the sample surface using liquid standards and a spraying device. For analysis, the generated thin layer is ablated simultaneously with the underlying sample. Thereby deviations in the ablation process and particle transport can be avoided. It could be shown that the developed method is highly versatile and could be easily adapted to the actual needs. Using silicon, silicon carbide, copper, aluminum, and glass as a matrix, excellent linear correlations between observed signal intensities and deposited amounts were found for the elements Zn, Ag, In, and Pb (R - values greater than 0.99). The method was applied to determine the content of sulfur, zinc, silver, indium, and lead in a commercial Kapton® polyimide film. The obtained results could be verified based on the homogeneously distributed sulfur by conventional liquid ICP-MS analysis after sample digestion, showing similar precision and accuracy. Lead was found to show a very inhomogeneous distribution in the Kapton® film, with concentration below the LOD at most measured locations and irregularly occurring spots with significantly higher concentrations. Finally, a quantitative depth profile of sulfur in a Kapton® film has been measured to assess the uptake of SO after a weathering experiment.
在过去的几年中,LA-ICP-MS 已成为分析来自各个研究领域的固体样品的一种有吸引力的技术。然而,在材料科学中的应用常常受到适当的有证标准物质的有限可用性的阻碍,而有证标准物质是准确量化的前提条件。因此,经常使用与样品组成相匹配并包含所有感兴趣元素的浓度水平的内部制备标准。然而,制备和表征此类标准通常是劳动密集型和耗时的。这项工作提出了一种基于标准加入概念的新方法来制造基质匹配标准。在第一步中,使用液体标准和喷涂设备将感兴趣的分析物均匀地沉积到样品表面上。为了进行分析,同时烧蚀生成的薄层和下面的样品。从而可以避免烧蚀过程和颗粒传输中的偏差。结果表明,该方法具有高度通用性,可以根据实际需求轻松进行调整。使用硅、碳化硅、铜、铝和玻璃作为基质,发现锌、银、铟和铅的元素观察到的信号强度与沉积量之间存在极好的线性相关性(R 值大于 0.99)。该方法应用于测定商用 Kapton®聚酰亚胺薄膜中硫、锌、银、铟和铅的含量。基于常规液体 ICP-MS 分析后样品消化后均匀分布的硫,可以验证获得的结果,显示出相似的精密度和准确性。在 Kapton®薄膜中发现铅的分布非常不均匀,大多数测量位置的浓度低于检测限,并且不规则地出现浓度明显较高的点。最后,测量了 Kapton®薄膜中硫的定量深度分布,以评估在风化实验后 SO 的吸收。