Hahn-Schickard, Allmandring 9b, 70569 Stuttgart, Germany.
Institute for Micro Integration (IFM), University of Stuttgart, Allmandring 9b, 70569 Stuttgart, Germany.
Sensors (Basel). 2023 Jan 18;23(3):1107. doi: 10.3390/s23031107.
Increasing demands for precision electronics require individual components such as resistors to be specified, as they can be the limiting factor within a circuit. To specify quality and long-term stability of resistors, noise measurements are a common method. This review briefly explains the theoretical background, introduces the noise index and provides an insight on how this index can be compared to other existing parameters. It then focuses on the different methods to measure excess noise in resistors. The respective advantages and disadvantages are pointed out in order to simplify the decision of which setup is suitable for a particular application. Each method is analyzed based on the integration of the device under test, components used, shielding considerations and signal processing. Furthermore, our results on the excess noise of resistors and resistor networks are presented using two different setups, one for very low noise measurements down to 20 µHz and one for broadband up to 100 kHz. The obtained data from these measurements are then compared to published data. Finally, first measurements on commercial strain gauges and inkjet-printed strain gauges are presented that show an additional 1/f component compared to commercial resistors and resistor networks.
对精密电子产品的需求不断增加,要求对电阻器等单个元件进行具体规定,因为它们可能是电路中的限制因素。为了指定电阻器的质量和长期稳定性,噪声测量是一种常用的方法。本文简要解释了理论背景,介绍了噪声指标,并提供了如何将该指标与其他现有参数进行比较的见解。然后,本文重点介绍了测量电阻器中过剩噪声的不同方法。为了简化对哪种设置适合特定应用的决策,指出了各自的优缺点。每种方法都基于测试器件的集成、使用的组件、屏蔽考虑因素和信号处理进行分析。此外,我们还使用两种不同的设置展示了电阻器和电阻器网络的过剩噪声的结果,一种用于低至 20µHz 的极低噪声测量,另一种用于高达 100kHz 的宽带。然后将这些测量获得的数据与已发表的数据进行比较。最后,本文还展示了对商用应变计和喷墨印刷应变计的首次测量结果,这些应变计与商用电阻器和电阻器网络相比显示出额外的 1/f 分量。