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双因子激励模式的磁通门传感器。

Fluxgate Sensor with Bifactor Excitation Mode.

机构信息

Laboratory of Information and Measuring Systems, National Academy of Sciences of the Kyrgyz Republic, Bishkek 720010, Kyrgyzstan.

Department of Electromechanics, Kyrgyz State Technical University Named after I. Razzakov, Bishkek 720010, Kyrgyzstan.

出版信息

Sensors (Basel). 2023 Feb 4;23(4):1775. doi: 10.3390/s23041775.

Abstract

The paper considers non-destructive testing (NTDs) as a means to solve the flaw detection problems of magnetic products. It proposes a new probe-coil magnetic-field NDT, not requiring the pre-magnetization of the test object material, which is mandatory for all conventional magnetic flaw detection techniques. A new bifactor excitation of the fluxgate sensor's sensitive element, based on double μ-transformation through the simultaneous activation of magnetic-modulating and electromagnetic-acoustic effects, is theoretically justified. The physical processes underlying the proposed technique are considered in detail, and a scheme for its practical implementation is described. The authors provide a variant of the new fluxgate's original design, implementing the proposed excitation technique. The specifics of implementing the fluxgate operating modes are analyzed, testifying to the possibility of detecting a given class of flaws with the required coverage as well as ensuring the required diagnostic resolution during flaw detection, which, in fact, indicates a more reliable identification of both the flaw type and location. Herewith, the new fluxgate type features the advantages of improved functionality and lower cost due to its simple design. The paper also considers a method to experimentally study the capabilities of the proposed fluxgate sensor with a new bifactor excitation in detail. The results of the experimental study into its key specifications are provided, confirming its high resolution, narrower zone of uncertainty, and the possibility of detecting smaller flaws at greater depths compared to available analogs.

摘要

本文将无损检测(NDT)视为解决磁性产品缺陷检测问题的一种手段。它提出了一种新的探头线圈磁场无损检测方法,不需要对测试对象材料进行预磁化,而这是所有常规磁性缺陷检测技术所必需的。从理论上证明了基于磁调制和电磁声效应同时激活的双μ变换对磁通门传感器敏感元件的双因子激励的合理性。详细考虑了所提出技术的基础物理过程,并描述了其实际实现方案。作者提供了一种新的磁通门原始设计的变体,实现了所提出的激励技术。分析了磁通门工作模式的实现细节,证明了在缺陷检测过程中用所需的覆盖率检测给定类型的缺陷的可能性,以及确保所需的诊断分辨率,这实际上表明可以更可靠地识别缺陷类型和位置。在此,由于设计简单,新型磁通门具有改进的功能和更低的成本优势。本文还详细考虑了一种利用新的双因子激励来实验研究所提出的磁通门传感器的能力的方法。提供了对其关键规格进行实验研究的结果,证实了其高分辨率、更小的不确定区以及与现有类似产品相比可以在更大深度检测更小缺陷的可能性。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/4ba0/9962411/17133d781e3f/sensors-23-01775-g001.jpg

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