Wang Jing, Yue Xiaofei, Zhu JunQiang, Hu Laigui, Liu Ran, Cong Chunxiao, Qiu Zhi-Jun
State Key Laboratory of ASIC & System, School of Information Science and Technology, Fudan University Shanghai 200433 China
Yiwu Research Institute of Fudan University Yiwu City 322000 Zhejiang China.
RSC Adv. 2023 Mar 8;13(12):7780-7788. doi: 10.1039/d3ra00324h.
Two-dimensional InSe has been considered as a promising candidate for novel optoelectronic devices owing to large electron mobility and a near-infrared optical band gap. However, its widespread applications suffer from environmental instability. A lot of theoretical studies on the degradation mechanism of InSe have been reported whereas the experimental proofs are few. Meanwhile, the role of the extrinsic environment is still obscure during the degradation. As a common technique of studying the degradation mechanism of 2D materials, laser irradiation exhibits many unique advantages, such as being fast, convenient, and offering compatibility. Here, we have developed a laser-treated method, which involves performing repeated measurements at the same point while monitoring the evolution of the resulting PL, to systematically study the photo-induced degradation process of InSe. Interestingly, we observe different evolution behavior of PL intensity under weak irradiation and strong irradiation. Our experimental results indicate the vacancy passivation and degrading effect simultaneously occurring in InSe under a weak laser irradiation, resulting in the PL increasing first and then decreasing during the measurement. Meanwhile we also notice that the passivation has a stronger effect on the PL than the degrading effect of weak oxidation. In contrast, under a strong laser irradiation, the InSe suffers serious destruction caused by excess heating and intense oxidation. This leads to a direct decrease of PL and corresponding oxidative products. Our work provides a reliable experimental supplement to the photo oxidation study of InSe and opens up a new avenue to regulate the PL of InSe.
二维硒化铟(InSe)因其高电子迁移率和近红外光学带隙,被认为是新型光电器件的理想候选材料。然而,其广泛应用受到环境不稳定性的困扰。目前已有大量关于InSe降解机制的理论研究报道,但实验证据较少。同时,在降解过程中外在环境的作用仍不明确。作为研究二维材料降解机制的常用技术,激光辐照具有许多独特优势,如快速、便捷且具有兼容性。在此,我们开发了一种激光处理方法,即在同一点进行重复测量并监测光致发光(PL)的变化,以系统研究InSe的光致降解过程。有趣的是,我们观察到在弱辐照和强辐照下PL强度呈现不同的变化行为。我们的实验结果表明,在弱激光辐照下,InSe中同时发生空位钝化和降解效应,导致测量过程中PL先增加后降低。同时我们还注意到,钝化对PL的影响比对弱氧化降解效应的影响更强。相比之下,在强激光辐照下,InSe会因过热和强烈氧化而遭受严重破坏,导致PL直接下降并产生相应的氧化产物。我们的工作为InSe的光氧化研究提供了可靠的实验补充,并为调控InSe的PL开辟了一条新途径。