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使用自支撑聚乙烯薄膜测量 200-800 eV 区域 sp 碳原子的质量吸收系数。

Mass absorption coefficient in the 200-800 eV region of sp carbon atoms measured using self-standing polyethylene thin films.

机构信息

Graduate School of Engineering, University of Hyogo, 2167 Shosha, Himeji, Hyogo, 671-2201, Japan.

出版信息

Anal Sci. 2023 Jul;39(7):1089-1096. doi: 10.1007/s44211-023-00318-4. Epub 2023 Mar 17.

DOI:10.1007/s44211-023-00318-4
PMID:36930238
Abstract

To experimentally determine the mass absorption coefficient (μ) of a sp-carbon (C) atom in the soft X-ray region, soft X-ray absorption spectra (XAS) in the 200-800 eV and C K regions of 200-nm-thick self-standing polyethylene (PE) films were measured in the transmission and total electron yield (TEY) modes. PE films were prepared by a spin-coating method. Their experimentally measured thickness and density are 200 nm and 0.920 g/cm, respectively. Soft X-ray absorption measurements were performed in beamline BL-6.3.2 at the Advanced Light Source. Although surface oxygen can be slightly observed in the O K and C K regions in TEY-XAS, it cannot be observed in absorbance-XAS. The absorbance-XAS profiles agree well with the calculated profiles, except in the C K threshold. Hence, it can be confirmed that the absorption-XAS measurements are achieved. From the absorbance, μ of sp-C in PE is 7 × 10 cm/g near 288 eV and 294 eV.

摘要

为了实验确定软 X 射线区 sp 碳(C)原子的质量吸收系数(μ),我们在透射和总电子产额(TEY)模式下测量了 200nm 厚的自支撑聚乙烯(PE)薄膜在 200-800eV 和 C K 区的软 X 射线吸收光谱(XAS)。PE 薄膜是通过旋涂法制备的。其实测厚度和密度分别为 200nm 和 0.920g/cm。软 X 射线吸收测量是在先进光源的 BL-6.3.2 光束线上进行的。尽管在 TEY-XAS 的 O K 和 C K 区可以观察到少量的表面氧,但在吸光度-XAS 中无法观察到。吸光度-XAS 谱与计算谱吻合良好,除了在 C K 阈之外。因此,可以确认吸收-XAS 测量是有效的。从吸光度来看,PE 中 sp-C 在 288eV 和 294eV 附近的质量吸收系数为 7×10cm/g。

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