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用于光电设备应用的 BaTiO 的光学研究和计算建模。

Optical investigation and computational modelling of BaTiO for optoelectronic devices applications.

机构信息

The Chemical Engineering Department, British University in Egypt (BUE), Cairo, 11387, Egypt.

The Electrical Engineering Department, and FabLab, at the Centre of Emerging Learning Technologies CELT, British University in Egypt (BUE), Cairo, 11387, Egypt.

出版信息

Sci Rep. 2023 Mar 23;13(1):4761. doi: 10.1038/s41598-023-31652-2.

Abstract

ABX perovskite-based materials have attracted research attention in various electronic and optoelectronic applications. The ability to tune the energy band gap through various dopants makes perovskites a potential candidate in many implementations. Among various perovskite materials, BaTiO has shown great applicability as a robust UV absorber with an energy band gap of around 3.2 eV. Herein, we provide a new sonochemical-assisted solid-phase method for preparing BaTiO thin films that optoelectronic devices can typically be used. BaTiO nano-powder and the thin film deposited on a glass substrate were characterized using physicochemical and optical techniques. In addition, the work demonstrated a computational attempt to optically model the BaTiO from the atomistic level using density functional theory to the thin film level using finite difference time domain Maxwell's equation solver. Seeking repeatability, the dispersion and the extinction behavior of the BaTiO thin film have been modeled using Lorentz-Dude (LD) coefficients, where all fitting parameters are listed. A numerical model has been experimentally verified using the experimental UV-Vis spectrometer measurements, recording an average root-mean-square error of 1.44%.

摘要

ABX 钙钛矿基材料在各种电子和光电应用中引起了研究关注。通过各种掺杂剂来调整能带隙的能力使钙钛矿成为许多应用中的潜在候选材料。在各种钙钛矿材料中,BaTiO 作为一种具有约 3.2 eV 能带隙的坚固 UV 吸收剂具有很大的适用性。在此,我们提供了一种新的超声化学辅助固相法来制备光电器件通常使用的 BaTiO 薄膜。使用物理化学和光学技术对 BaTiO 纳米粉末和沉积在玻璃基底上的薄膜进行了表征。此外,该工作还展示了一种使用密度泛函理论从原子级到使用有限差分时域麦克斯韦方程求解器的薄膜级对 BaTiO 进行光学建模的计算尝试。为了寻求重复性,使用洛伦兹-杜德 (LD) 系数对 BaTiO 薄膜的色散和消光行为进行了建模,其中列出了所有拟合参数。使用实验 UV-Vis 分光光度计测量对数值模型进行了实验验证,记录的平均均方根误差为 1.44%。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/3926/10036486/90d200620ba7/41598_2023_31652_Fig1_HTML.jpg

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