Fujian Provincial Collaborative Innovation Center for Advanced High-Field Superconducting Materials and Engineering, College of Physics and Energy, Fujian Normal University, Fuzhou, Fujian 350117, China.
Frontier Institute of Science and Technology (FIST), Xi'an Jiaotong University, Xi'an, Shaanxi 710049, China.
J Colloid Interface Sci. 2023 Aug;643:38-46. doi: 10.1016/j.jcis.2023.04.027. Epub 2023 Apr 8.
Memristors, which combine the behaviors of memory and resistive switching (RS), have a wide application prospect in information processing and artificial neural networks. The RS memory behaviors of memristors are primarily determined by the functional layer materials, device structure, and working conditions. Herein, a CuMnO nanomaterial with the manganese copper ore structure was prepared on a Ti substrate by hydrothermal method, and a memristor with the Ag/CuMnO/Ti sandwich structure was developed. The RS memory behavior of the as-prepared memristor can be regulated through a low magnetic field (MF), and thus the resistance value of device shows a multi-level resistance states. Compared with other regulation factors, the MF can remotely adjust and control the RS characteristics of memristor, which is a non-invasive and non-destructive regulatory means. The MF regulated memristor can not only be used for multi-level high-density information storage, but also it can protect the health of special populations by identifying the MF intensity of the surrounding environment. When the device is operated in an MF environment, the change of resistance value of the device in both high resistance state (HRS) and low resistance state (LRS) is mainly attributed to the influence of Loren magnetic force on conductive ions.
忆阻器结合了记忆和电阻式开关 (RS) 的行为,在信息处理和人工神经网络中有广泛的应用前景。忆阻器的 RS 记忆行为主要由功能层材料、器件结构和工作条件决定。在此,通过水热法在 Ti 衬底上制备了具有锰铜矿结构的 CuMnO 纳米材料,并开发了具有 Ag/CuMnO/Ti 三明治结构的忆阻器。所制备的忆阻器的 RS 记忆行为可以通过低磁场 (MF) 进行调节,从而使器件的电阻值呈现出多级电阻状态。与其他调节因素相比,MF 可以远程调节和控制忆阻器的 RS 特性,这是一种非侵入性和无损的调节手段。MF 调节的忆阻器不仅可以用于多级高密度信息存储,而且可以通过识别周围环境的 MF 强度来保护特殊人群的健康。当器件在 MF 环境中工作时,器件在高电阻状态 (HRS) 和低电阻状态 (LRS) 下的电阻值变化主要归因于洛伦磁力对导电离子的影响。