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[O-HO] 离子对的光解动力学。

Photodissociation Dynamics of the [O-HO] Ionic Complex.

机构信息

Hefei National Research Center for Physical Sciences at the Microscale, and Department of Chemical Physics, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China.

出版信息

J Phys Chem A. 2023 Jul 13;127(27):5629-5636. doi: 10.1021/acs.jpca.3c01628. Epub 2023 Jun 29.

Abstract

We present an experimental study on the photodissociation dynamics of [O-HO] in the 580-266 nm wavelength range using a cryogenic ion trap velocity map imaging spectrometer. The cryogenic ion trap produces mass selected and internally cold ions for photodissociation. By detecting both the O and HO photofragments using the time-of-flight mass spectrometry and velocity map imaging techniques, branching ratios and total kinetic energy release distributions of the O + HO and HO + O product channels are experimentally measured at 16 different excitation energies. State-resolved photodissociation mechanisms of the parent [O-HO] are interpreted as (1) the O(XΣ) + HO, O(aΔ) + HO, and O(XΣ) + HO channels are produced from direct dissociation of [O-HO] in its excited , , and states, respectively; (2) the O(XΠ) + channel is produced from nonadiabatic relaxations of the excited , , and states to the ground state with subsequent dissociation. The latter nonadiabatic processes involve charge-transfer on the potential energy surfaces, and the charge-transfer probabilities are determined from experimental results. The dissociation energy of the ground state to the lowest dissociation limit is experimentally refined as = 1.05 ± 0.05 eV. This work provides important information to understand the charge-transfer dynamics in the photochemistry of [O-HO] and in the ion-molecule reaction O + HO → O + HO.

摘要

我们在 580-266nm 波长范围内使用低温离子阱速度图成像光谱仪对 [O-HO] 的光解动力学进行了实验研究。低温离子阱产生质量选择和内部冷的离子进行光解。通过使用飞行时间质谱和速度图成像技术检测 O 和 HO 光碎片,在 16 种不同的激发能量下实验测量了 O + HO 和 HO + O 产物通道的分支比和总动能释放分布。将母体 [O-HO] 的态分辨光解机制解释为:(1)O(XΣ) + HO、O(aΔ) + HO 和 O(XΣ) + HO 通道分别由 [O-HO] 在其激发的 、 和 态中的直接解离产生;(2)O(XΠ) + 通道是由激发态、和到基态的非绝热弛豫产生的,随后发生解离。后者的非绝热过程涉及到势能面上的电荷转移,电荷转移概率由实验结果确定。基态到最低解离极限的解离能通过实验精修为 = 1.05 ± 0.05eV。这项工作为理解 [O-HO] 光化学中的电荷转移动力学以及 O + HO → O + HO 的离子-分子反应提供了重要信息。

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