Beamcon III，一种用于光学探测器的线性度测量仪器。
Beamcon III, a Linearity Measurement Instrument for Optical Detectors.
作者信息
Thompson Ambler, Chen How-More
机构信息
National Institute of Standards and Technology, Gaithersburg, MD 20899-0001.
Department of Electrical and Computer Engineering, University of Alabama in Huntsville, Huntsville, AL 35899.
出版信息
J Res Natl Inst Stand Technol. 1994 Nov-Dec;99(6):751-755. doi: 10.6028/jres.099.067.
The design and operation of Beamcon III, the latest linearity measurement instrument using the beam addition method in the detector metrology program at the National Institute of Standards and Technology, is described. The primary improvements in this instrument are the reduction of stray radiation to extremely low levels by using three well-baffled chambers, a larger dynamic range, and an additional source entrance port. A polynomial response function is determined from the data obtained by this instrument using a least-squares method. The linearity of a silicon photodiode-amplifier detector system was determined to be within 0.054 % (2 estimate) over nine decades of signal.
本文介绍了国家标准与技术研究所探测器计量项目中最新的采用光束相加法的线性度测量仪器Beamcon III的设计与操作。该仪器的主要改进包括：通过使用三个精心设置光阑的腔室将杂散辐射降低到极低水平、更大的动态范围以及一个额外的光源入口端口。利用最小二乘法从该仪器获得的数据中确定了多项式响应函数。在九个数量级的信号范围内，硅光电二极管 - 放大器探测器系统的线性度被确定在0.054%（2估计）以内。
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