使用双孔径法进行分光光度计线性测试。
Spectrophotometer linearity testing using the double-aperture method.
作者信息
Mielenz K D, Eckerle K L
出版信息
Appl Opt. 1972 Oct 1;11(10):2294-303. doi: 10.1364/AO.11.002294.
PMID:20119328
Abstract
The double-aperture method has been used to determine the nonlinearity correction for a new spectrophotometer having a precision of +/-4 x 10(-5) transmittance units. The random and systematic errors of the method are discussed, and techniques are described that yield the additive nonlinearity correction to the high level of precision required for this spectrophotometer. The correction was found to be independent of source polarization, free from interference errors, but slightly dependent on wavelength.
摘要
双孔径法已被用于确定一台新分光光度计的非线性校正，该分光光度计的精度为±4×10⁻⁵透光率单位。讨论了该方法的随机误差和系统误差，并描述了一些技术，这些技术能产生该分光光度计所需高精度的附加非线性校正。发现该校正与光源偏振无关，无干扰误差，但略微依赖于波长。
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