Henan Key Laboratory of Infrared Materials & Spectrum Measures and Applications, School of Physics, Henan Normal University, Xinxiang 453007, China.
Sensors (Basel). 2023 Jul 5;23(13):6157. doi: 10.3390/s23136157.
This paper verified through experiments that change in ambient temperature are the main cause of dark output noise drift. Additionally, the impact of dark output noise drift in fiber optic spectrometers on emissivity measurements has been investigated in this work. Based on an improved fiber optic spectrometer, two methods were proposed for characterizing and correcting the dark output noise offset in fiber optic spectrometers: the mean correction scheme and the linear fitting correction scheme. Compared to the mean correction scheme, the linear fitting correction scheme is more effective in solving the problem of dark output noise drift. When the wavelength is greater than 1600 nm, the calibration relative error of silicon carbide (SIC) emissivity is less than 0.8% by the mean correction scheme, while the calibration relative error of silicon carbide emissivity is less than 0.62% by the linear fitting correction scheme. This work solves the problem of dark output noise drift in prolonged measurement based on fiber optic spectrometers, improving the accuracy and reliability of emissivity and quantitative radiation measurement.
本文通过实验验证了环境温度的变化是暗输出噪声漂移的主要原因。此外，本工作还研究了光纤光谱仪中暗输出噪声漂移对发射率测量的影响。基于改进的光纤光谱仪，提出了两种用于表征和校正光纤光谱仪中暗输出噪声偏移的方法：均值校正方案和线性拟合校正方案。与均值校正方案相比，线性拟合校正方案在解决暗输出噪声漂移问题方面更为有效。当波长大于 1600nm 时，通过均值校正方案，碳化硅（SIC）发射率的校准相对误差小于 0.8%，而通过线性拟合校正方案，碳化硅发射率的校准相对误差小于 0.62%。本工作解决了基于光纤光谱仪的长时间测量中暗输出噪声漂移的问题，提高了发射率和定量辐射测量的准确性和可靠性。
