Zhang Yu-Feng, Dai Jing-Min, Zhang Yu, Pan Wei-Dong, Zhang Lei
School of Electrical Engineering and Automation, Harbin Institute of Technology, Harbin 150001, China.
Guang Pu Xue Yu Guang Pu Fen Xi. 2013 Aug;33(8):2267-71.
In view of the influence of non-ideal reference standard on spectral emissivity measurement, by analyzing the principle of infrared emissivity measurement system based on integrating sphere reflectometer, a calibration method suitable for measuring spectral emissivity system using the reflection measurement was proposed. By fitting a spectral reflectance curve of the reference standard sample to the given reflectance data, the correction coefficient of measurement system was computed. Then the output voltage curve of reference standard sample was corrected by this coefficient. The system error caused by the imperfection of reference standard was eliminated. The correction method was applied to the spectral emissivity measurement system based on integrating sphere reflectometer. The results measured by the corrected system and the results measured by energy comparison measurement were compared to verify the feasibility and effectivity of this correction method in improving the accuracy of spectral emissivity measurement.
针对非理想参考标准对光谱发射率测量的影响，通过分析基于积分球反射仪的红外发射率测量系统原理，提出了一种适用于采用反射测量法的光谱发射率测量系统的校准方法。通过将参考标准样品的光谱反射率曲线拟合到给定的反射率数据，计算出测量系统的校正系数。然后用该系数对参考标准样品的输出电压曲线进行校正。消除了因参考标准不完善而导致的系统误差。将该校正方法应用于基于积分球反射仪的光谱发射率测量系统。对比经校正系统测量的结果与能量比较测量法测量的结果，以验证该校正方法在提高光谱发射率测量精度方面的可行性和有效性。
