Moradi Amin, Rog Matthijs, Stam Guido, Tromp R M, van der Molen S J
Leiden Institute of Physics, Niels Bohrweg2, Leiden, the Netherlands.
Leiden Institute of Physics, Niels Bohrweg2, Leiden, the Netherlands; IBM T.J.Watson Research Center, Yorktown Heights, New York 10598, United States.
Ultramicroscopy. 2023 Nov;253:113809. doi: 10.1016/j.ultramic.2023.113809. Epub 2023 Jul 8.
A new, complementary technique based on Photo Emission Electron Microscopy (PEEM) is demonstrated. In contrast to PEEM, the sample is placed on a transparent substrate and is illuminated from the back side while electrons are collected from the other (front) side. In this paper, the working principle of this technique, coined back-illuminated PEEM (BIPEEM), is described. In BIPEEM, the electron intensity is strongly thickness-dependent. This dependence can be described by a simple model which contains the optical attenuation length and the electron mean free path. Electrons forming an image in BIPEEM hence carry information of the inner part of the sample, as well as of the surface, as we demonstrate experimentally.
展示了一种基于光发射电子显微镜（PEEM）的新型互补技术。与PEEM不同的是，样品放置在透明基板上，从背面照明，同时从另一面（正面）收集电子。本文描述了这种被称为背照式PEEM（BIPEEM）技术的工作原理。在BIPEEM中，电子强度强烈依赖于厚度。这种依赖性可以用一个包含光学衰减长度和电子平均自由程的简单模型来描述。正如我们通过实验所证明的，在BIPEEM中形成图像的电子因此携带了样品内部以及表面的信息。
