• 文献检索
  • 文档翻译
  • 深度研究
  • 学术资讯
  • Suppr Zotero 插件Zotero 插件
  • 邀请有礼
  • 套餐&价格
  • 历史记录
应用&插件
Suppr Zotero 插件Zotero 插件浏览器插件Mac 客户端Windows 客户端微信小程序
定价
高级版会员购买积分包购买API积分包
服务
文献检索文档翻译深度研究API 文档MCP 服务
关于我们
关于 Suppr公司介绍联系我们用户协议隐私条款
关注我们

Suppr 超能文献

核心技术专利:CN118964589B侵权必究
粤ICP备2023148730 号-1Suppr @ 2026

文献检索

告别复杂PubMed语法,用中文像聊天一样搜索,搜遍4000万医学文献。AI智能推荐,让科研检索更轻松。

立即免费搜索

文件翻译

保留排版,准确专业,支持PDF/Word/PPT等文件格式,支持 12+语言互译。

免费翻译文档

深度研究

AI帮你快速写综述,25分钟生成高质量综述,智能提取关键信息,辅助科研写作。

立即免费体验

Fifth-order asymptotic geometric aberrations of electron lenses.

作者信息

Liu Zhixiong

机构信息

Department of Electronics, School of Electronics Peking University, Beijing 100871, China.

出版信息

Ultramicroscopy. 2023 Dec;254:113776. doi: 10.1016/j.ultramic.2023.113776. Epub 2023 Jun 6.

DOI:10.1016/j.ultramic.2023.113776
PMID:37544853
Abstract

In this article the analytical expressions of the fifth-order asymptotic geometric aberrations of electron lenses are derived by Mathematica. The process of the derivation is analogous to the method described in "Principles of Electron Optics" by P.W. Hawkes and E. Kasper. All the analytical formulae for asymptotic aberration coefficients in polynomials in the reciprocal magnification are numerically cross-validated with the differential algebraic (DA) method. The results indicate that the derived formulae are doubtless correct.

摘要

相似文献

1
Fifth-order asymptotic geometric aberrations of electron lenses.
Ultramicroscopy. 2023 Dec;254:113776. doi: 10.1016/j.ultramic.2023.113776. Epub 2023 Jun 6.
2
Third-rank chromatic aberrations of electron lenses.
Ultramicroscopy. 2018 Feb;185:27-31. doi: 10.1016/j.ultramic.2017.11.006. Epub 2017 Nov 14.
3
First- and third-order chromatic aberrations in Glaser magnetic lens for object magnetic immersion.用于物体磁浸没的格拉泽磁透镜中的一阶和三阶色差。
Heliyon. 2023 Nov 24;9(12):e22825. doi: 10.1016/j.heliyon.2023.e22825. eCollection 2023 Dec.
4
Differential algebraic method for aberration analysis of typical electrostatic lenses.
Ultramicroscopy. 2006 Feb;106(3):220-32. doi: 10.1016/j.ultramic.2005.07.005. Epub 2005 Aug 8.
5
High order aberration calculations of a quadrupole-octupole corrector using a differential algebra method.使用微分代数方法计算四极-八极校正器的高次像差。
Ultramicroscopy. 2018 Dec;195:21-24. doi: 10.1016/j.ultramic.2018.08.017. Epub 2018 Aug 27.
6
Design of electrostatic lenses through genetic algorithm and particle swarm optimisation methods integrated with differential algebra.
Ultramicroscopy. 2024 Dec;266:114024. doi: 10.1016/j.ultramic.2024.114024. Epub 2024 Aug 15.
7
High order aberrations calculations of Wien filters using differential algebra methods.
Ultramicroscopy. 2020 Mar;210:112924. doi: 10.1016/j.ultramic.2019.112924. Epub 2019 Dec 30.
8
The addition of chromatic aberration coefficients.色差系数的相加。
Ultramicroscopy. 2004 May;99(2-3):197-200. doi: 10.1016/j.ultramic.2003.12.006.
9
Aberrations in asymmetrical electron lenses.非对称电子透镜中的像差。
Ultramicroscopy. 2012 Aug;119:40-4. doi: 10.1016/j.ultramic.2011.11.014. Epub 2011 Nov 25.
10
Correction of parasitic aberrations of hexapole corrector using differential algebra method.利用微分代数方法校正六极校正器的寄生像差。
Ultramicroscopy. 2019 Sep;204:81-90. doi: 10.1016/j.ultramic.2019.05.006. Epub 2019 May 17.