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从剖析到探测:用于表征纳米工程植入物的原子力显微镜

Profiling to Probing: Atomic force microscopy to characterize nano-engineered implants.

作者信息

Gulati Karan, Adachi Taiji

机构信息

Institute for Life and Medical Sciences, Kyoto University, Sakyo, Kyoto 606-8507, Japan; The University of Queensland, School of Dentistry, Herston QLD 4006, Australia.

Institute for Life and Medical Sciences, Kyoto University, Sakyo, Kyoto 606-8507, Japan.

出版信息

Acta Biomater. 2023 Oct 15;170:15-38. doi: 10.1016/j.actbio.2023.08.006. Epub 2023 Aug 9.

DOI:10.1016/j.actbio.2023.08.006
PMID:37562516
Abstract

Surface modification of implants in the nanoscale or implant nano-engineering has been recognized as a strategy for augmenting implant bioactivity and achieving long-term implant success. Characterizing and optimizing implant characteristics is crucial to achieving desirable effects post-implantation. Modified implant enables tailored, guided and accelerated tissue integration; however, our understanding is limited to multicellular (bulk) interactions. Finding the nanoscale forces experienced by a single cell on nano-engineered implants will aid in predicting implants' bioactivity and engineering the next generation of bioactive implants. Atomic force microscope (AFM) is a unique tool that enables surface characterization and understanding of the interactions between implant surface and biological tissues. The characterization of surface topography using AFM to gauge nano-engineered implants' characteristics (topographical, mechanical, chemical, electrical and magnetic) and bioactivity (adhesion of cells) is presented. A special focus of the review is to discuss the use of single-cell force spectroscopy (SCFS) employing AFM to investigate the minute forces involved with the adhesion of a single cell (resident tissue cell or bacterium) to the surface of nano-engineered implants. Finally, the research gaps and future perspectives relating to AFM-characterized current and emerging nano-engineered implants are discussed towards achieving desirable bioactivity performances. This review highlights the use of advanced AFM-based characterization of nano-engineered implant surfaces via profiling (investigating implant topography) or probing (using a single cell as a probe to study precise adhesive forces with the implant surface). STATEMENT OF SIGNIFICANCE: Nano-engineering is emerging as a surface modification platform for implants to augment their bioactivity and achieve favourable treatment outcomes. In this extensive review, we closely examine the use of Atomic Force Microscopy (AFM) to characterize the properties of nano-engineered implant surfaces (topography, mechanical, chemical, electrical and magnetic). Next, we discuss Single-Cell Force Spectroscopy (SCFS) via AFM towards precise force quantification encompassing a single cell's interaction with the implant surface. This interdisciplinary review will appeal to researchers from the broader scientific community interested in implants and cell adhesion to implants and provide an improved understanding of the surface characterization of nano-engineered implants.

摘要

植入物的纳米级表面改性或植入物纳米工程已被视为增强植入物生物活性并实现植入物长期成功的一种策略。表征和优化植入物特性对于实现植入后的理想效果至关重要。改性植入物能够实现定制化、引导性和加速性的组织整合;然而,我们的理解仅限于多细胞(整体)相互作用。了解单个细胞在纳米工程植入物上所经历的纳米级力,将有助于预测植入物的生物活性并设计下一代生物活性植入物。原子力显微镜(AFM)是一种独特的工具,可用于表面表征以及了解植入物表面与生物组织之间的相互作用。本文介绍了使用AFM对纳米工程植入物的特性(形貌、机械、化学、电学和磁学)和生物活性(细胞粘附)进行表面形貌表征。本综述的一个特别重点是讨论使用基于AFM的单细胞力谱(SCFS)来研究单个细胞(驻留组织细胞或细菌)与纳米工程植入物表面粘附所涉及的微小力。最后,针对实现理想的生物活性性能,讨论了与AFM表征的当前和新兴纳米工程植入物相关的研究差距和未来展望。本综述强调了通过轮廓分析(研究植入物形貌)或探测(使用单个细胞作为探针来研究与植入物表面的精确粘附力)对纳米工程植入物表面进行基于AFM的先进表征。重要性声明:纳米工程正在成为一种用于植入物的表面改性平台,以增强其生物活性并实现良好的治疗效果。在这篇全面的综述中,我们仔细研究了使用原子力显微镜(AFM)来表征纳米工程植入物表面的特性(形貌、机械、化学、电学和磁学)。接下来,我们讨论通过AFM进行的单细胞力谱(SCFS),以实现对单个细胞与植入物表面相互作用的精确力量化。这篇跨学科综述将吸引更广泛科学界中对植入物以及细胞与植入物粘附感兴趣的研究人员,并增进对纳米工程植入物表面表征的理解。

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