Department of Prosthodontics, Ordu University, Ordu, Turkey.
Department of Reconstructive Dentistry and Gerodontology, School of Dental Medicine, University of Bern, Bern, Switzerland.
J Prosthet Dent. 2024 Jul;132(1):211-218. doi: 10.1016/j.prosdent.2023.06.028. Epub 2023 Aug 17.
Implementation of fabrication trueness analysis by using a recently introduced nonmetrology-grade freeware program may help clinicians and dental laboratory technicians in their routine practice. However, knowledge of the performance of this freeware program when compared with the International Organization for Standardization recommended metrology-grade analysis software program is limited.
The purpose of this in vitro study was to evaluate the effect of an analysis software program on measured deviations in the complete arch, implant-supported framework scans.
A total of 20 complete arch, implant-supported frameworks were fabricated from a master standard tessellation language (STL) file from either polyetheretherketone (PEEK) or titanium (Ti) (n=10). All frameworks were then digitized by using different scanners to generate test STLs. All STL files were imported into a nonmetrology-grade freeware program (Medit Link) and a metrology-grade software program (Geomagic Control X) to measure the overall and marginal deviations of frameworks from the master STL file by using the root mean square (RMS) method. Data were analyzed by using the two 1-sided paired t test procedure, in which 50 µm was considered as the minimal clinically meaningful difference (α=.05).
When overall RMS values were considered, the nonmetrology-grade freeware program was not inferior to the metrology-grade software program (P<.05). When marginal RMS values were considered, the nonmetrology-grade freeware program was inferior to the metrology-grade software program only when PEEK frameworks were scanned with an E4 laboratory scanner (P>.05).
The use of the tested nonmetrology-grade freeware program resulted in overall deviation measurements similar to those when a metrology-grade software program was used. The freeware program was inferior when marginal deviations were analyzed on E4 scans of a PEEK framework, which was the only scanner-material pair that led to a significant difference, among the 15 pairs tested.
使用最近引入的非计量级免费软件程序进行制造精度分析，可以帮助临床医生和牙科实验室技术人员在日常实践中。然而，与国际标准化组织推荐的计量级分析软件程序相比，该免费软件程序的性能知之甚少。
本体外研究的目的是评估分析软件程序对全弓、种植体支持框架扫描测量偏差的影响。
从聚醚醚酮（PEEK）或钛（Ti）的主标准 tessellation language（STL）文件中制作了总共 20 个全弓、种植体支持框架（n=10）。然后，使用不同的扫描仪对所有框架进行数字化，以生成测试 STL。将所有 STL 文件导入非计量级免费软件程序（Medit Link）和计量级软件程序（Geomagic Control X），使用均方根（RMS）法测量框架相对于主 STL 文件的整体和边缘偏差。通过使用 2 个单边配对 t 检验程序分析数据，其中 50 µm 被认为是最小的临床有意义差异（α=.05）。
当考虑整体 RMS 值时，非计量级免费软件程序并不逊于计量级软件程序（P<.05）。当考虑边缘 RMS 值时，只有当 PEEK 框架用 E4 实验室扫描仪扫描时，非计量级免费软件程序才逊于计量级软件程序（P>.05）。
使用测试的非计量级免费软件程序进行总体偏差测量与使用计量级软件程序相似。当分析 E4 扫描的 PEEK 框架的边缘偏差时，免费软件程序较差，这是在测试的 15 对扫描仪-材料对中唯一导致显著差异的对。
