Department of Chemistry and Biochemistry, Brigham Young University, Provo, UT 84602, USA.
Department of Applied Physics, Eindhoven University of Technology, 5600 MB Eindhoven, the Netherlands.
J Chromatogr A. 2023 Sep 27;1707:464248. doi: 10.1016/j.chroma.2023.464248. Epub 2023 Jul 27.
Surface silanols (Si-OH) play a vital role on fused silica surfaces in chromatography. Here, we used an atmospheric-pressure, gas-phase reactor to modify the inner surface of a gas chromatography, fused silica capillary column (0.53 mm ID) with a small, reactive silane (tris(dimethylamino)methylsilane, TDMAMS). The deposition of TDMAMS on planar witness samples around the capillary was confirmed with X-ray photoelectron spectroscopy (XPS), ex situ spectroscopic ellipsometry (SE), and wetting. The number of surface silanols on unmodified and TDMAMS-modified native oxide-terminated silicon were quantified by tagging with dimethylzinc (DMZ) via atomic layer deposition (ALD) and counting the resulting zinc atoms with high sensitivity-low energy ion scattering (HS-LEIS). A bare, clean native oxide - terminated silicon wafer has 3.66 OH/nm, which agrees with density functional theory (DFT) calculations from the literature. After TDMAMS modification of native oxide-terminated silicon, the number of surface silanols decreases by a factor of ca. 10 (to 0.31 OH/nm). Intermediate surface testing (IST) was used to characterize the surface activities of functionalized capillaries. It suggested a significant deactivation/passivation of the capillary with some surface silanols remaining; the modified capillary shows significant deactivation compared to the native/unmodified fused silica tubing. We believe that this methodology for determining the number of residual silanols on silanized fused silica will be enabling for chromatography.
表面硅醇(Si-OH)在色谱法中对熔融石英表面起着至关重要的作用。在这里,我们使用常压气相反应器,用一种小的反应性硅烷(三(二甲氨基)甲基硅烷,TDMAMS)来修饰气相色谱熔融石英毛细管柱(0.53mm ID)的内表面。用 X 射线光电子能谱(XPS)、在位光谱椭圆偏振(SE)和润湿来证实 TDMAMS 在毛细管周围的平面参比样品上的沉积。用原子层沉积(ALD)用二甲基锌(DMZ)标记未修饰和 TDMAMS 修饰的本征氧化层终止硅表面的硅醇数目,并通过高灵敏度低能量离子散射(HS-LEIS)计数生成的锌原子来定量。一个裸露的、清洁的本征氧化层终止的硅片有 3.66 个 OH/nm,这与文献中的密度泛函理论(DFT)计算结果一致。在对本征氧化层终止的硅进行 TDMAMS 修饰后,表面硅醇的数量减少了约 10 倍(至 0.31 OH/nm)。中间表面测试(IST)用于对功能化毛细管的表面活性进行表征。它表明,由于一些表面硅醇的存在,毛细管的失活/钝化程度较大;与未修饰的熔融石英管相比,修饰后的毛细管的失活程度明显较大。我们相信,这种确定硅烷化熔融石英上残留硅醇数量的方法将为色谱法提供支持。