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振幅分辨单粒子分光光度法:用于等离激元纳米粒子高通量尺寸表征的强大工具。

Amplitude-Resolved Single Particle Spectrophotometry: A Robust Tool for High-Throughput Size Characterization of Plasmonic Nanoparticles.

作者信息

Calvo Rodrigo, Pini Valerio, Thon Andreas, Saad Asis, Salvador-Matar Antonio, Manso Silván Miguel, Ahumada Óscar

机构信息

Mecwins S.A., Ronda de Poniente, 15 2°D, Tres Cantos, 28760 Madrid, Spain.

Departamento de Física Aplicada, Universidad Autónoma de Madrid, Campus de Cantoblanco, 28049 Madrid, Spain.

出版信息

Nanomaterials (Basel). 2023 Aug 23;13(17):2401. doi: 10.3390/nano13172401.

Abstract

Plasmonic nanoparticles have a wide range of applications in science and industry. Despite the numerous synthesis methods reported in the literature over the last decades, achieving precise control over the size and shape of large nanoparticle populations remains a challenge. Since variations in size and shape significantly affect the plasmonic properties of nanoparticles, accurate metrological techniques to characterize their morphological features are essential. Here, we present a novel spectrophotometric method, called Amplitude-Resolved Single Particle Spectrophotometry, that can measure the individual sizes of thousands of particles with nanometric accuracy in just a few minutes. This new method, based on the measurement of the scattering amplitude of each nanoparticle, overcomes some of the limitations observed in previous works and theoretically allows the characterization of nanoparticles of any size with a simple extra calibration step. As proof of concept, we characterized thousands of spherical nanoparticles of different sizes. This new method shows excellent accuracy, with less than a 3% discrepancy in direct comparison with transmission electron microscopy. Although the effectiveness of this method has been demonstrated with spherical nanoparticles, its real strength lies in its adaptability to more complex geometries by using an alternative analytical method to the one described here.

摘要

等离子体纳米颗粒在科学和工业领域有着广泛的应用。尽管在过去几十年的文献中报道了众多合成方法,但要对大量纳米颗粒的尺寸和形状实现精确控制仍然是一项挑战。由于尺寸和形状的变化会显著影响纳米颗粒的等离子体特性,因此用于表征其形态特征的精确计量技术至关重要。在此,我们提出一种新型分光光度法,称为振幅分辨单颗粒分光光度法,它能够在短短几分钟内以纳米精度测量数千个颗粒的个体尺寸。这种新方法基于对每个纳米颗粒散射振幅的测量,克服了先前研究中观察到的一些局限性,并且理论上通过一个简单的额外校准步骤就能够对任何尺寸的纳米颗粒进行表征。作为概念验证,我们对数千个不同尺寸的球形纳米颗粒进行了表征。这种新方法显示出极高的精度,与透射电子显微镜直接比较时差异小于3%。尽管该方法对球形纳米颗粒的有效性已得到证明,但其真正优势在于通过使用此处所述方法之外的替代分析方法,它能够适应更复杂的几何形状。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/c637/10490240/4640efa8457f/nanomaterials-13-02401-g001.jpg

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