Chinnaraj Rajesh Kumar, Kim Young Chan, Choi Seong Man
Department of Aerospace Engineering, Jeonbuk National University, Jeonju-si 54896, Republic of Korea.
Materials (Basel). 2023 Aug 30;16(17):5929. doi: 10.3390/ma16175929.
We studied the behavioral characteristics of a newly developed dual-layer ablator, which uses carbon-phenolic as a recession layer and silica-phenolic as an insulating layer. The ablator specimens were tested in a 0.4 MW supersonic arc-jet plasma wind tunnel, employing two different shapes (flat-faced and hemispherical-faced) and varying thicknesses of the carbon-phenolic recession layer. The specimens underwent two test conditions, namely, stationary tests (7.5 MW/m, ~40 s) and transient tests simulating an interplanetary spacecraft re-entry heat flux trajectory (6.25↔9.4 MW/m, ~108 s). During the stationary tests, stagnation point temperatures of the specimens were measured. Additionally, internal temperatures of the specimens were measured at three locations for both stationary and transient tests: inside the carbon-phenolic recession layer, inside the silica-phenolic insulating layer, and at the recession layer-insulating layer intersection. The hemispherical-faced specimen surface temperatures were about 3000 K, which is about 350 K higher than those of flat-faced specimens, resulting in higher internal temperatures. The recession layer internal temperatures rose more exponentially when moved closer to the specimen stagnation point. Layer interaction and insulating layer internal temperatures were found to be dependent on both the recession layer thickness and the exposed surface shape. The change in exposed surface shape increased mass loss and recession, with hemispherical-faced specimens showing ~1.4-fold higher values than the flat-faced specimens.
我们研究了一种新开发的双层烧蚀器的行为特性,该烧蚀器使用碳酚醛作为衰退层,二氧化硅酚醛作为绝缘层。烧蚀器试样在0.4兆瓦的超音速电弧喷射等离子体风洞中进行测试,采用两种不同形状(平面和半球面)以及不同厚度的碳酚醛衰退层。试样经历了两种测试条件,即静态测试(7.5兆瓦/平方米,约40秒)和模拟行星际航天器再入热流轨迹的瞬态测试(6.25↔9.4兆瓦/平方米,约108秒)。在静态测试期间,测量了试样的驻点温度。此外,在静态和瞬态测试中,在三个位置测量了试样的内部温度:碳酚醛衰退层内部、二氧化硅酚醛绝缘层内部以及衰退层与绝缘层的交界处。半球面试样的表面温度约为3000K,比平面试样高约350K,导致内部温度更高。当靠近试样驻点时,衰退层内部温度上升得更呈指数级。发现层间相互作用和绝缘层内部温度取决于衰退层厚度和暴露表面形状。暴露表面形状的变化增加了质量损失和衰退,半球面试样的值比平面试样高约1.4倍。