Lv Xiang, Guo Ning, Lv Wenzhen, Liu Ruoting, Qu Song, Ouyang Ruizhuo
Department of Chemistry, University of Shanghai for Science and Technology, Shanghai 200093, P. R. China.
Key Laboratory for Organic Electronics and Information Displays & Institute of Advanced Materials, Jiangsu National Synergetic Innovation Center for Advanced Materials, Nanjing University of Posts and Telecommunications, Nanjing 210023, P. R. China.
Inorg Chem. 2023 Sep 25;62(38):15747-15756. doi: 10.1021/acs.inorgchem.3c02627. Epub 2023 Sep 11.
Pr-related intervalence charge transfer (IVCT) bands are a research hotspot owing to their amelioration in the luminescence thermal quenching of Pr-activated phosphors. Here, a typical IVCT band displacement strategy via a topological chemical scheme is reported to optimize the luminescence thermal quenching performance of praseodymium-doped niobo-tantalate. The substitution of Ta ions for Nb ions reduces the valence-weighted average cation optical electronegativity and increases the bond lengths of the activator (Pr) to the ligand cations (Nb and Ta) via adjusting the crystal structure, leading to an increase in the IVCT energy level position from 3.521 to 4.139 eV. The increase in the IVCT energy level leads to an increase in the number of electrons located in the Pr P energy level, which compensates for the emission of D during warming. Especially, the energy gap value of the IVCT band is positively correlated with the thermal quenching activation energy Δ. Δ increases, the crossover point rises, and the nonradiative transition decreases, further enhancing the Pr D emission. At 503 K, the D emission integral intensity increases from 14 to 224% relative to the 303 K original integral intensity. This IVCT band displacement strategy can be used as a scheme for designing antithermal quenching luminescence materials.
与Pr相关的价间电荷转移(IVCT)带由于其在Pr激活的荧光粉发光热猝灭方面的改善而成为研究热点。在此,报道了一种通过拓扑化学方案的典型IVCT带位移策略,以优化掺镨铌钽酸盐的发光热猝灭性能。用Ta离子取代Nb离子降低了价加权平均阳离子光学电负性,并通过调整晶体结构增加了激活剂(Pr)与配体阳离子(Nb和Ta)之间的键长,导致IVCT能级位置从3.521 eV增加到4.139 eV。IVCT能级的增加导致位于Pr P能级的电子数量增加,这补偿了升温过程中D的发射。特别是,IVCT带的能隙值与热猝灭活化能Δ呈正相关。Δ增加,交叉点上升,非辐射跃迁减少,进一步增强了Pr D发射。在503 K时,相对于303 K时的原始积分强度,D发射积分强度从14%增加到224%。这种IVCT带位移策略可作为设计抗热猝灭发光材料的一种方案。