Peng Min, Nan Chang, Wang Dawei, Cao Meng, Zhang Liang, Liu Laijun, Liu Chunliang, Fang Dangqi, Zhang Yiqi, Zhai Yonggui, Li Yongdong
Key Laboratory for Physical Electronics and Devices of the Ministry of Education, School of Electronic Science and Engineering, Xi'an Jiaotong University, Xi'an 710049, China.
State Key Laboratory for Mechanical Behavior of Materials, School of Microelectronics, Xi'an Jiaotong University, Xi'an 710049, China.
Nanomaterials (Basel). 2023 Sep 12;13(18):2550. doi: 10.3390/nano13182550.
Secondary electron emission (SEE) is a fundamental phenomenon of particle/surface interaction, and the multipactor effect induced by SEE can result in disastrous impacts on the performance of microwave devices. To suppress the SEE-induced multipactor, an Ni (111) surface covered with a monolayer of graphene was proposed and studied theoretically via the density functional theory (DFT) method. The calculation results indicated that redistribution of the electron density at the graphene/Ni (111) interface led to variations in the work function and the probability of SEE. To validate the theoretical results, experiments were performed to analyze secondary electron yield (SEY). The measurements showed a significant decrease in the SEY on an Ni (111) surface covered with a monolayer of graphene, accompanied by a decrease in the work function, which is consistent with the statistical evidence of a strong correlation between the work function and SEY of metals. A discussion was given on explaining the experimental phenomenon using theoretical calculation results, where the empty orbitals lead to an electron trapping effect, thereby reducing SEY.
二次电子发射(SEE)是粒子与表面相互作用的一种基本现象,由SEE引起的次级电子倍增效应会对微波器件的性能产生灾难性影响。为了抑制SEE引起的次级电子倍增,提出了一种覆盖有单层石墨烯的Ni(111)表面,并通过密度泛函理论(DFT)方法进行了理论研究。计算结果表明,石墨烯/Ni(111)界面处电子密度的重新分布导致了功函数和SEE概率的变化。为了验证理论结果,进行了实验以分析二次电子产额(SEY)。测量结果表明,覆盖有单层石墨烯的Ni(111)表面的SEY显著降低,同时功函数也降低,这与金属的功函数和SEY之间存在强相关性的统计证据一致。利用理论计算结果对实验现象进行了解释,其中空轨道导致电子俘获效应,从而降低了SEY。